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165 Publications
2019 | Conference Paper | LibreCat-ID: 12918
Maaz, Mohammad Urf, et al. “A Hybrid Space Compactor for Adaptive X-Handling.” 50th IEEE International Test Conference (ITC), IEEE, 2019, pp. 1–8.
LibreCat
2018 | Misc | LibreCat-ID: 4576
Sprenger, Alexander, and Sybille Hellebrand. Stochastische Kompaktierung für den Hochgeschwindigkeitstest. 30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18), 2018.
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2018 | Journal Article | LibreCat-ID: 12974
Hellebrand, Sybille, et al. “Guest Editors’ Introduction - Special Issue on Approximate Computing.” IEEE Embedded Systems Letters, vol. 10, no. 1, IEEE, 2018, pp. 1–1, doi:10.1109/les.2018.2789942.
LibreCat
| DOI
2018 | Journal Article | LibreCat-ID: 13057
Kampmann, Matthias, and Sybille Hellebrand. “Design For Small Delay Test - A Simulation Study.” Microelectronics Reliability, vol. 80, 2018, pp. 124–33.
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2018 | Misc | LibreCat-ID: 13072
Kampmann, Matthias, and Sybille Hellebrand. Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test. 2018.
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2018 | Conference Paper | LibreCat-ID: 29460
Rezaeizadeh Rookerd, Ramin, et al. “Performance and Energy Enhancement through an Online Single/Multi Level Mode Switching Cache Architecture.” Proceedings of the 2018 on Great Lakes Symposium on VLSI, ACM, 2018, doi:10.1145/3194554.3194599.
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 4575
Sprenger, Alexander, and Sybille Hellebrand. “Tuning Stochastic Space Compaction to Faster-than-at-Speed Test.” 2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), IEEE, 2018, doi:10.1109/ddecs.2018.00020.
LibreCat
| DOI
2018 | Conference Paper | LibreCat-ID: 10575
Liu, Chang, et al. “Extending Aging Monitors for Early Life and Wear-Out Failure Prevention.” 27th IEEE Asian Test Symposium (ATS’18), 2018, doi:10.1109/ats.2018.00028.
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| DOI
2018 | Conference Paper | LibreCat-ID: 29459
Sadeghi-Kohan, Somayeh, et al. “Near-Optimal Node Selection Procedure for Aging Monitor Placement.” 2018 IEEE 24th International Symposium on On-Line Testing And Robust System Design (IOLTS), IEEE, 2018, doi:10.1109/iolts.2018.8474120.
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| DOI
2017 | Conference Paper | LibreCat-ID: 12973
Deshmukh, Jyotirmoy, et al. “Special Session on Early Life Failures.” 35th IEEE VLSI Test Symposium (VTS’17), IEEE, 2017, doi:10.1109/vts.2017.7928933.
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| DOI