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165 Publications
2017 | Misc | LibreCat-ID: 13078
Kampmann, M., & Hellebrand, S. (2017). X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz.
LibreCat
2017 | Conference Paper | LibreCat-ID: 10576
Kampmann, M., & Hellebrand, S. (2017). Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test. 20th IEEE International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS’17). https://doi.org/10.1109/ddecs.2017.7934564
LibreCat
| DOI
2017 | Journal Article | LibreCat-ID: 29462
Sadeghi-Kohan, S., Kamal, M., & Navabi, Z. (2017). Self-Adjusting Monitor for Measuring Aging Rate and Advancement. IEEE Transactions on Emerging Topics in Computing, 8(3), 627–641. https://doi.org/10.1109/tetc.2017.2771441
LibreCat
| DOI
2017 | Conference Paper | LibreCat-ID: 29463
Jenihhin, M., Kamkin, A., Navabi, Z., & Sadeghi-Kohan, S. (2017). Universal mitigation of NBTI-induced aging by design randomization. 2016 IEEE East-West Design & Test Symposium (EWDTS). https://doi.org/10.1109/ewdts.2016.7807635
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2016 | Conference Paper | LibreCat-ID: 12975
Kampmann, M., & Hellebrand, S. (2016). X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test. In 25th IEEE Asian Test Symposium (ATS’16) (pp. 1–6). Hiroshima, Japan: IEEE. https://doi.org/10.1109/ats.2016.20
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2015 | Conference Paper | LibreCat-ID: 12976
Kampmann, M., A. Kochte, M., Schneider, E., Indlekofer, T., Hellebrand, S., & Wunderlich, H.-J. (2015). Optimized Selection of Frequencies for Faster-Than-at-Speed Test. In 24th IEEE Asian Test Symposium (ATS’15) (pp. 109–114). Mumbai, India: IEEE. https://doi.org/10.1109/ats.2015.26
LibreCat
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2015 | Journal Article | LibreCat-ID: 13056
Huang, Z., Liang, H., & Hellebrand, S. (2015). A High Performance SEU Tolerant Latch. Journal of Electronic Testing - Theory and Applications (JETTA), 31(4), 349–359.
LibreCat
2015 | Misc | LibreCat-ID: 13077
Hellebrand, S., Indlekofer, T., Kampmann, M., Kochte, M., Liu, C., & Wunderlich, H.-J. (2015). Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler. 27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany.
LibreCat
2015 | Conference Paper | LibreCat-ID: 29465
Sadeghi-Kohan, S., Kamran, A., Forooghifar, F., & Navabi, Z. (2015). Aging in digital circuits and age monitoring: Object-oriented modeling and evaluation. 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). https://doi.org/10.1109/dtis.2015.7127373
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2015 | Conference Paper | LibreCat-ID: 29466
Sadeghi-Kohan, S., Kamal, M., McNeil, J., Prinetto, P., & Navabi, Z. (2015). Online self adjusting progressive age monitoring of timing variations. 2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS). https://doi.org/10.1109/dtis.2015.7127368
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