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165 Publications
2024 | Conference Paper | LibreCat-ID: 52744
Jafarzadeh, Hanieh, et al. “Time and Space Optimized Storage-Based BIST under Multiple Voltages and Variations.” European Test Symposium, The Hague, Netherlands, May 20-24, 2024, IEEE, p. 6.
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2024 | Conference Paper | LibreCat-ID: 52742
Jafarzadeh, Hanieh, et al. “Vmin Testing under Variations: Defect vs. Fault Coverage.” IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024, IEEE, p. 6.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52743
Hellebrand, Sybille, et al. “Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
LibreCat
2024 | Conference Paper | LibreCat-ID: 52745
Wunderlich, Hans-Joachim, et al. “Robust Test of Small Delay Faults under PVT-Variations.” International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024, p. 1.
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2024 | Misc | LibreCat-ID: 50284
Stiballe, Alisa, et al. Modeling Crosstalk-Induced Interconnect Delay with Polynomial Regression. 37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024, 2024.
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2023 | Misc | LibreCat-ID: 35204
Ghazal, Abdulkarim, et al. On Cryptography Effects on Interconnect Reliability. 35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023, 2023.
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2023 | Dissertation | LibreCat-ID: 46482 | 
Sprenger, Alexander. Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen. Universität Paderborn, 2023, doi:10.17619/UNIPB/1-1787.
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2023 | Conference Paper | LibreCat-ID: 46739
Sadeghi-Kohan, Somayeh, et al. “Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication.” 2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W), IEEE, 2023, doi:10.1109/dsn-w58399.2023.00056.
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2023 | Conference Paper | LibreCat-ID: 46738
Sadeghi-Kohan, Somayeh, et al. “Optimizing the Streaming of Sensor Data with Approximate Communication.” IEEE Asian Test Symposium (ATS’23), October 2023, 2023.
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2023 | Journal Article | LibreCat-ID: 46264
Sadeghi-Kohan, Somayeh, et al. “Workload-Aware Periodic Interconnect BIST.” IEEE Design &Test, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–1, doi:10.1109/mdat.2023.3298849.
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