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165 Publications
2024 | Conference Paper | LibreCat-ID: 52744
@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Time and Space Optimized Storage-based BIST under Multiple Voltages and Variations}, booktitle={European Test Symposium, The Hague, Netherlands, May 20-24, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52742
@inproceedings{Jafarzadeh_Klemme_Amrouch_Hellebrand_Wunderlich, title={Vmin Testing under Variations: Defect vs. Fault Coverage}, booktitle={IEEE Latin American Test Symposium (LATS), Maceió, Brazil, April 9-12, 2024}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, pages={6} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52743
@inproceedings{Hellebrand_Sadeghi-Kohan_Wunderlich, title={Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, pages={1} }
LibreCat
2024 | Conference Paper | LibreCat-ID: 52745
@inproceedings{Wunderlich_Jafarzadeh_Hellebrand, title={Robust Test of Small Delay Faults under PVT-Variations}, booktitle={International Symposium of EDA (ISEDA), Xi’an, China, May 10-13, 2024}, author={Wunderlich, Hans-Joachim and Jafarzadeh, Hanieh and Hellebrand, Sybille}, pages={1} }
LibreCat
2024 | Misc | LibreCat-ID: 50284
@book{Stiballe_Reimer_Sadeghi-Kohan_Hellebrand_2024, place={Darmstadt, Germany}, title={Modeling Crosstalk-induced Interconnect Delay with Polynomial Regression}, publisher={37. ITG / GMM / GI -Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’24), Feb. 2024}, author={Stiballe, Alisa and Reimer, Jan Dennis and Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2024} }
LibreCat
2023 | Misc | LibreCat-ID: 35204
@book{Ghazal_Sadeghi-Kohan_Reimer_Hellebrand_2023, place={Erfurt, Germany}, title={On Cryptography Effects on Interconnect Reliability}, publisher={35. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’23), Feb. 2023}, author={Ghazal, Abdulkarim and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2023} }
LibreCat
2023 | Dissertation | LibreCat-ID: 46482 | 
@book{Sprenger_2023, place={Paderborn}, title={Testinstrumente und Testdatenanalyse zur Verarbeitung von Unsicherheiten in Logikblöcken hochintegrierter Schaltungen}, DOI={10.17619/UNIPB/1-1787}, publisher={Universität Paderborn}, author={Sprenger, Alexander}, year={2023} }
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2023 | Conference Paper | LibreCat-ID: 46739
@inproceedings{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Low Power Streaming of Sensor Data Using Gray Code-Based Approximate Communication}, DOI={10.1109/dsn-w58399.2023.00056}, booktitle={2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
| DOI
2023 | Conference Paper | LibreCat-ID: 46738
@inproceedings{Sadeghi-Kohan_Reimer_Hellebrand_Wunderlich_2023, place={Beijing, China}, title={Optimizing the Streaming of Sensor Data with Approximate Communication}, booktitle={IEEE Asian Test Symposium (ATS’23), October 2023}, author={Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2023 | Journal Article | LibreCat-ID: 46264
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2023, title={Workload-Aware Periodic Interconnect BIST}, DOI={10.1109/mdat.2023.3298849}, journal={IEEE Design &Test}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023}, pages={1–1} }
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| Download (ext.)
2023 | Conference Paper | LibreCat-ID: 45830
@inproceedings{Jafarzadeh_Klemme_Reimer_Najafi Haghi_ Amrouch_Hellebrand_ Wunderlich_2023, place={Anaheim, CA, USA}, title={Robust Pattern Generation for Small Delay Faults under Process Variations}, booktitle={IEEE International Test Conference (ITC’23), Anaheim, USA, October 2023}, publisher={IEEE}, author={Jafarzadeh, Hanieh and Klemme, Florian and Reimer, Jan Dennis and Najafi Haghi, Zahra Paria and Amrouch, Hussam and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2023} }
LibreCat
2022 | Journal Article | LibreCat-ID: 29351
@article{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, title={Stress-Aware Periodic Test of Interconnects}, DOI={10.1007/s10836-021-05979-5}, journal={Journal of Electronic Testing}, publisher={Springer Science and Business Media LLC}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
| DOI
2022 | Misc | LibreCat-ID: 29890
@book{Sadeghi-Kohan_Hellebrand_Wunderlich_2022, place={Online}, title={EM-Aware Interconnect BIST}, publisher={European Workshop on Silicon Lifecycle Management, March 18, 2022}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2022} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 19422
@inproceedings{Sprenger_Sadeghi-Kohan_Reimer_Hellebrand_2020, place={Virtual Conference - Originally Frascati (Rome), Italy}, title={Variation-Aware Test for Logic Interconnects using Neural Networks - A Case Study}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT’20), October 2020}, author={Sprenger, Alexander and Sadeghi-Kohan, Somayeh and Reimer, Jan Dennis and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Misc | LibreCat-ID: 15419
@book{Sadeghi-Kohan_Hellebrand_2020, place={Ludwigsburg}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, publisher={32. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’20), 16. - 18. Februar 2020}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
2020 | Conference Paper | LibreCat-ID: 29200
@inproceedings{Sadeghi-Kohan_Hellebrand_2020, place={Virtual Conference - Originally San Diego, CA, USA}, title={Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects}, DOI={10.1109/vts48691.2020.9107591}, booktitle={38th IEEE VLSI Test Symposium (VTS)}, publisher={IEEE}, author={Sadeghi-Kohan, Somayeh and Hellebrand, Sybille}, year={2020} }
LibreCat
| DOI
2020 | Conference Paper | LibreCat-ID: 19421
@inproceedings{Holst_Kampmann_Sprenger_Reimer_Hellebrand_Wunderlich_Weng_2020, place={Virtual Conference - Originally Washington, DC, USA}, title={Logic Fault Diagnosis of Hidden Delay Defects}, booktitle={IEEE International Test Conference (ITC’20), November 2020}, author={Holst, Stefan and Kampmann, Matthias and Sprenger, Alexander and Reimer, Jan Dennis and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Weng, Xiaoqing}, year={2020} }
LibreCat
2019 | Misc | LibreCat-ID: 8112
@book{Maaz_Sprenger_Hellebrand_2019, place={Prien am Chiemsee}, title={A Hybrid Space Compactor for Varying X-Rates}, publisher={31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19)}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019} }
LibreCat
2019 | Journal Article | LibreCat-ID: 8667
@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012}, number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–23} }
LibreCat
| DOI
2019 | Journal Article | LibreCat-ID: 13048
@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968} }
LibreCat