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165 Publications
2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
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| DOI
2003 | Misc | LibreCat-ID: 13098
Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.
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2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
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| DOI
2002 | Misc | LibreCat-ID: 13097
Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.
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2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
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| DOI
2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, 2002, pp. 157–68.
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2002 | Journal Article | LibreCat-ID: 13070
Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.
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2001 | Misc | LibreCat-ID: 13096
Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.
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2001 | Conference Paper | LibreCat-ID: 13004
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
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| DOI
2001 | Journal Article | LibreCat-ID: 13047
Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), vol. 38, no. 8, 2001, p. 931.
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2001 | Journal Article | LibreCat-ID: 13068
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 17, no. 3/4, 2001, pp. 341–49.
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2000 | Misc | LibreCat-ID: 13094
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Hardwarepraktikum Im Diplomstudiengang Informatik. 2000.
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2000 | Misc | LibreCat-ID: 13095
Hellebrand, Sybille, et al. A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters. 2000.
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2000 | Conference Paper | LibreCat-ID: 13005
Hellebrand, Sybille, et al. “A Mixed Mode BIST Scheme Based on Reseeding of Folding Counters.” IEEE International Test Conference (ITC’00), IEEE, 2000, pp. 778–84, doi:10.1109/test.2000.894274.
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| DOI
1999 | Book | LibreCat-ID: 13065
Hellebrand, Sybille. Selbsttestbare Steuerwerke - Strukturen Und Syntheseverfahren. Verlag Dr. Kovac, Hamburg, 1999.
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1999 | Misc | LibreCat-ID: 13093
Hellebrand, Sybille, et al. Exploiting Symmetries to Speed Up Transparent BIST. 1999.
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1999 | Conference Paper | LibreCat-ID: 13006
Hellebrand, Sybille, et al. “Error Detecting Refreshment for Embedded DRAMs.” 17th IEEE VLSI Test Symposium (VTS’99), IEEE, 1999, pp. 384–90, doi:10.1109/vtest.1999.766693.
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| DOI
1999 | Conference Paper | LibreCat-ID: 13066
N. Yarmolik, Vyacheslav, et al. “Transparent Word-Oriented Memory BIST Based on Symmetric March Algorithms.” Third European Dependable Computing Conference (EDCC-3), 1999.
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1999 | Conference Paper | LibreCat-ID: 13067
Hellebrand, Sybille, et al. “Symmetric Transparent BIST for RAMs.” Design Automation and Test in Europe (DATE’99), 1999, pp. 702–07.
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1998 | Report | LibreCat-ID: 13029
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Test Und Synthese Schneller Eingebetteter Systeme. 1998.
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1998 | Misc | LibreCat-ID: 13091
N. Yarmolik, Vyacheslav, et al. Efficient Consistency Checking for Embedded Memories. 1998.
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1998 | Misc | LibreCat-ID: 13092
N. Yarmolik, Vyacheslav, et al. Efficient Consistency Checking for Embedded Memories. 1998.
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1998 | Book Chapter | LibreCat-ID: 13060
Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” Mixed-Mode BIST Using Embedded Processors, Kluwer Academic Publishers, 1998.
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1998 | Journal Article | LibreCat-ID: 13061
Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” Journal of Electronic Testing Theory and Applications - JETTA, vol. 12, no. 1/2, 1998, pp. 127–38.
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1998 | Journal Article | LibreCat-ID: 13064
Hellebrand, Sybille, et al. “Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications.” IEEE Design and Test, vol. 15, no. 4, IEEE, 1998, pp. 36–41.
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1998 | Conference Paper | LibreCat-ID: 13007
Hertwig, Andre, et al. “Fast Self-Recovering Controllers.” 16th IEEE VLSI Test Symposium (VTS’98), IEEE, 1998, pp. 296–302, doi:10.1109/vtest.1998.670883.
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| DOI
1998 | Conference Paper | LibreCat-ID: 13008
Hellebrand, Sybille, et al. “Self-Adjusting Output Data Compression: An Efficient BIST Technique for RAMs.” Design Automation and Test in Europe (DATE’98), 1998, pp. 173–79, doi:10.1109/date.1998.655853.
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| DOI
1998 | Conference Paper | LibreCat-ID: 13063
N. Yarmolik, Vyacheslav, et al. “New Transparent RAM BIST Based on Self-Adjusting Output Data Compression.” Design & Diagnostics of Electronic Circuits & Systems (DDECS’98), 1998, pp. 27–33.
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1997 | Misc | LibreCat-ID: 13089
Tsai, Kun-Han, et al. STARBIST: Scan Autocorrelated Random Pattern Generation. 1997.
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1997 | Misc | LibreCat-ID: 13090
Hertwig, Andre, et al. Synthesis of Fast On-Line Testable Controllers for Data-Dominated Applications. 1997.
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1997 | Conference Paper | LibreCat-ID: 13009
Tsai, Kun-Han, et al. “STARBIST: Scan Autocorrelated Random Pattern Generation.” 34th ACM/IEEE Design Automation Conference (DAC’97), IEEE, 1997, doi:10.1109/dac.1997.597194.
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1996 | Misc | LibreCat-ID: 13087
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Using Embedded Processors for BIST. 1996.
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1996 | Misc | LibreCat-ID: 13088
Hellebrand, Sybille, et al. Mixed-Mode BIST Using Embedded Processors. 1996.
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1996 | Conference Paper | LibreCat-ID: 13010
Hellebrand, Sybille, et al. “Mixed-Mode BIST Using Embedded Processors.” IEEE International Test Conference (ITC’96), IEEE, 1996, pp. 195–204, doi:10.1109/test.1996.556962.
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1995 | Report | LibreCat-ID: 13026
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Synthesis Procedures for Self-Testable Controllers. 1995.
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1995 | Report | LibreCat-ID: 13027
Hellebrand, Sybille, et al. Evaluation of Self-Testable Controller Architectures Based on Realistic Fault Analysis. 1995.
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1995 | Report | LibreCat-ID: 13028
Hellebrand, Sybille, et al. Partitioning of CMOS-Circuits for On-Chip IDDQ-Testing. 1995.
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1995 | Misc | LibreCat-ID: 13086
Hellebrand, Sybille, et al. Pattern Generation for a Deterministic BIST Scheme. 1995.
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1995 | Journal Article | LibreCat-ID: 13011
Hellebrand, Sybille, et al. “Built-In Test for Circuits with Scan Based on Reseeding of Multiple-Polynomial Linear Feedback Shift Registers.” IEEE Transactions on Computers, vol. 44, no. 2, IEEE, 1995, pp. 223–33, doi:10.1109/12.364534.
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1995 | Conference Paper | LibreCat-ID: 13012
Hellebrand, Sybille, et al. “Pattern Generation for a Deterministic BIST Scheme.” ACM/IEEE International Conference on Computer Aided Design (ICCAD’95), IEEE, 1995, pp. 88–94, doi:10.1109/iccad.1995.479997.
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| DOI
1994 | Report | LibreCat-ID: 13024
Hellebrand, Sybille, et al. Synthesis for Off-Line Testability. 1994.
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1994 | Report | LibreCat-ID: 13025
Hellebrand, Sybille, et al. Chip Level Test Planning for Controlling the Tradeoff between Hardware Overhead and Test Time. 1994.
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1994 | Misc | LibreCat-ID: 13083
Venkataraman, Srikanth, et al. Effiziente Testsatzkodierung Für Prüfpfad-Basierte Selbsttestarchitekturen. 1994.
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1994 | Misc | LibreCat-ID: 13084
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Ein Verfahren Zur Testfreundlichen Steuerwerkssynthese. 1994.
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1994 | Misc | LibreCat-ID: 13085
Hellebrand, Sybille, et al. Synthesis for Testability - the ARCHIMEDES Approach. 1994.
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1994 | Conference Paper | LibreCat-ID: 13014
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “An Efficient Procedure for the Synthesis of Fast Self-Testable Controller Structures.” ACM/IEEE International Conference on Computer-Aided Design (ICCAD’94), IEEE, 1994, pp. 110–16, doi:10.1109/iccad.1994.629752.
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| DOI
1994 | Conference Paper | LibreCat-ID: 13059
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Synthese Schneller Selbsttestbarer Steuerwerke.” Tagungsband Der GI/GME/ITG-Fachtagung \& Rechnergestützter Entwurf Und Architektur Mikroelektronischer Systeme, 1994, pp. 3–11.
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1994 | Conference Paper | LibreCat-ID: 13013
Hellebrand, Sybille, and Hans-Joachim Wunderlich. “Synthesis of Self-Testable Controllers.” European Design and Test Conference (EDAC/ETC/EUROASIC), 1994, pp. 580–85, doi:10.1109/edtc.1994.326815.
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| DOI
1993 | Misc | LibreCat-ID: 13081
Hellebrand, Sybille, et al. Effiziente Erzeugung Deterministischer Muster Im Selbsttest. 1993.
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1993 | Misc | LibreCat-ID: 13082
Hellebrand, Sybille, and Hans-Joachim Wunderlich. Synthesis of Self-Testable Controllers. 1993.
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