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165 Publications
2010 | Conference Paper | LibreCat-ID: 13051
@inproceedings{Hunger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={81–88} }
LibreCat
2010 | Misc | LibreCat-ID: 13073
@book{Hellebrand_2010, place={Editorial, it 4/2010, pp. 179-180}, title={Nano-Electronic Systems}, author={Hellebrand, Sybille}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 12983
@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={19th IEEE Asian Test Symposium (ATS’10)}, publisher={IEEE}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12985
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={28th IEEE International Conference on Computer Design (ICCD’10)}, publisher={IEEE}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12986
@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 12988
@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={10.1109/vts.2010.5469570}, booktitle={28th IEEE VLSI Test Symposium (VTS’10)}, publisher={IEEE}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }
LibreCat
| DOI
2010 | Conference Paper | LibreCat-ID: 13049
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
LibreCat
2010 | Conference Paper | LibreCat-ID: 13050
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Robuster Selbsttest mit extremer Kompaktierung}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={17–24} }
LibreCat
2009 | Conference Paper | LibreCat-ID: 12991
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Sesimbra-Lisbon, Portugal}, title={ATPG-Based Grading of Strong Fault-Secureness}, DOI={10.1109/iolts.2009.5196027}, booktitle={15th IEEE International On-Line Testing Symposium (IOLTS’09}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}, year={2009} }
LibreCat
| DOI
2009 | Conference Paper | LibreCat-ID: 12990
@inproceedings{Hellebrand_Hunger_2009, place={Chicago, IL, USA}, title={Are Robust Circuits Really Robust?}, DOI={10.1109/dft.2009.28}, booktitle={24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}, publisher={IEEE}, author={Hellebrand, Sybille and Hunger, Marc}, year={2009}, pages={77} }
LibreCat
| DOI
2009 | Conference Paper | LibreCat-ID: 13030
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Stuttgart, Germany}, title={Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}, booktitle={3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}, year={2009} }
LibreCat
2008 | Misc | LibreCat-ID: 13033
@book{Coym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich}, title={Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}, author={Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}, year={2008} }
LibreCat
2008 | Misc | LibreCat-ID: 13035
@book{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich}, title={Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 12992
@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}, publisher={IEEE}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12994
@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={10.1109/vts.2008.34}, booktitle={26th IEEE VLSI Test Symposium (VTS’08)}, publisher={IEEE}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 12993
@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={10.1109/iolts.2008.32}, booktitle={14th IEEE International On-Line Testing Symposium (IOLTS’08)}, publisher={IEEE}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
| DOI
2008 | Conference Paper | LibreCat-ID: 13031
@inproceedings{Hunger_Hellebrand_2008, place={Ingolstadt, Germany}, title={Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
LibreCat
2008 | Conference Paper | LibreCat-ID: 13032
@inproceedings{Oehler_Bosio_Di Natale_Hellebrand_2008, place={Ingolstadt, Germany}, title={Modularer Selbsttest und optimierte Reparaturanalyse}, booktitle={2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
LibreCat
2007 | Misc | LibreCat-ID: 13038
@book{Hellebrand_2007, place={5th IEEE East-West Design \& Test Symposium, Yerevan, Armenia (Invited Talk)}, title={Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13039
@book{Ali_Welzl_Hessler_Hellebrand_2007, place={DATE 2007 Friday Workshop on Diagnostic Services in Network-on-Chips, Nice, France, (Poster)}, title={An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13042
@book{Oehler_Hellebrand_Wunderlich_2007, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Erlangen, Germany}, title={An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2007 | Misc | LibreCat-ID: 13043
@book{Hellebrand_2007, place={ForschungsForum Paderborn, 10. Ausgabe, Paderborn, Germany}, title={Qualitätssicherung für Nanochips - Wie IT-Produkte zuverlässig werden}, author={Hellebrand, Sybille}, year={2007} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}, publisher={IEEE}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12996
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Krakow, Poland}, title={Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair}, DOI={10.1109/ddecs.2007.4295278}, booktitle={10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={185–190} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 12997
@inproceedings{Oehler_Hellebrand_Wunderlich_2007, place={Freiburg, Germany}, title={An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy}, DOI={10.1109/ets.2007.10}, booktitle={12th IEEE European Test Symposium (ETS’07)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2007}, pages={91–96} }
LibreCat
| DOI
2007 | Conference Paper | LibreCat-ID: 13037
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Bled, Slovenia}, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, booktitle={43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13036
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
LibreCat
2007 | Journal Article | LibreCat-ID: 13044
@article{Ali_Hessler_Welzl_Hellebrand_2007, title={An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip}, volume={1}, number={2}, journal={International Journal on High Performance Systems Architecture}, author={Ali, Muhammad and Hessler, Sven and Welzl, Michael and Hellebrand, Sybille}, year={2007}, pages={113–123} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13040
@inproceedings{Ali_Welzl_Hessler_Hellebrand_2007, place={Las Vegas, Nevada, USA}, title={A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip}, booktitle={4th International Conference on Information Technology: New Generations (ITNG’07)}, author={Ali, Muhammad and Welzl, Michael and Hessler, Sven and Hellebrand, Sybille}, year={2007}, pages={1027–1032} }
LibreCat
2007 | Conference Paper | LibreCat-ID: 13041
@inproceedings{Becker_Polian_Hellebrand_Straube_Wunderlich_2007, place={Munich, Germany}, title={Test und Zuverlässigkeit nanoelektronischer Systeme}, booktitle={1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2007} }
LibreCat
2006 | Journal Article | LibreCat-ID: 13045
@article{Becker_Polian_Hellebrand_Straube_Wunderlich_2006, title={DFG-Projekt RealTest - Test und Zuverlässigkeit nanoelektronischer Systeme}, volume={48}, number={5}, journal={it - Information Technology}, author={Becker, Bernd and Polian, Ilia and Hellebrand, Sybille and Straube, Bernd and Wunderlich, Hans-Joachim}, year={2006}, pages={305–311} }
LibreCat
2005 | Misc | LibreCat-ID: 13046
@book{Oehler_Hellebrand_2005, place={Kleinheubachertagung 2005, Miltenberg, Germany}, title={A Low Power Design for Embedded DRAMs with Online Consistency Checking}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13101
@book{Ali_Welzl_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Dynamic Routing: A Prerequisite for Reliable NoCs}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Misc | LibreCat-ID: 13102
@book{Oehler_Hellebrand_2005, place={17th GI/ITG/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Innsbruck, Austria}, title={Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005} }
LibreCat
2005 | Conference Paper | LibreCat-ID: 12999
@inproceedings{Ali_Welzl_Zwicknagl_Hellebrand_2005, place={Islamabad, Pakistan}, title={Considerations for Fault-Tolerant Networks on Chips}, DOI={10.1109/icm.2005.1590063}, booktitle={IEEE International Conference on Microelectronics (ICM’05)}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Zwicknagl, Martin and Hellebrand, Sybille}, year={2005} }
LibreCat
| DOI
2005 | Conference Paper | LibreCat-ID: 13000
@inproceedings{Oehler_Hellebrand_2005, place={Tallinn, Estonia}, title={Low Power Embedded DRAMs with High Quality Error Correcting Capabilities}, DOI={10.1109/ets.2005.28}, booktitle={10th IEEE European Test Symposium (ETS’05)}, publisher={IEEE}, author={Oehler, Philipp and Hellebrand, Sybille}, year={2005}, pages={148–153} }
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| DOI
2005 | Conference Paper | LibreCat-ID: 12998
@inproceedings{Ali_Welzl_Hellebrand_2005, place={Oulu, Finland}, title={A Dynamic Routing Mechanism for Network on Chip}, DOI={10.1109/norchp.2005.1596991}, booktitle={23rd IEEE NORCHIP Conference}, publisher={IEEE}, author={Ali, Muhammad and Welzl, Michael and Hellebrand, Sybille}, year={2005}, pages={70–73} }
LibreCat
| DOI
2004 | Conference Paper | LibreCat-ID: 13071
@inproceedings{Liu Jing_Ruehrup_Schindelhauer_Volbert_Dierkes_Bellgardt_Ibers_Hilleringmann_2004, place={Tilburg, Netherlands}, title={Sensor Networks with More Features Using Less Hardware}, booktitle={{GOR/NGB Conference Tilburg 2004}}, author={Liu Jing, Michelle and Ruehrup, Stefan and Schindelhauer, Christian and Volbert, Klaus and Dierkes, Martin and Bellgardt, Andreas and Ibers, Rüdiger and Hilleringmann, Ulrich}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13099
@book{Breu_Fahringer_Fensel_Hellebrand_Middeldorp_Scherzer_2004, place={OCG Journal, pp. 28-29}, title={Im Westen viel Neues - Informatik an der Universität Innsbruck}, author={Breu, Ruth and Fahringer, Thomas and Fensel, Dieter and Hellebrand, Sybille and Middeldorp, Aart and Scherzer, Otmar}, year={2004} }
LibreCat
2004 | Misc | LibreCat-ID: 13100
@book{Hellebrand_Wuertenberger_S. Tautermann_2004, place={9th IEEE European Test Symposium, Ajaccio, Corsica, France}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, author={Hellebrand, Sybille and Wuertenberger, Armin and S. Tautermann, Christofer}, year={2004} }
LibreCat
2004 | Conference Paper | LibreCat-ID: 13001
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2004, place={Charlotte, NC, USA}, title={Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, DOI={10.1109/test.2004.1387357}, booktitle={IEEE International Test Conference (ITC’04)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2004}, pages={926–935} }
LibreCat
| DOI
2003 | Misc | LibreCat-ID: 13098
@book{Breu_Hellebrand_Welzl_2003, place={Handouts ACS/IEEE Workshop on Practice and Experience with Java in Education, Tunis, Tunisia}, title={Experiences from Teaching Software Development in a Java Environment}, author={Breu, Ruth and Hellebrand, Sybille and Welzl, Michael}, year={2003} }
LibreCat
2003 | Conference Paper | LibreCat-ID: 13002
@inproceedings{Wuertenberger_S. Tautermann_Hellebrand_2003, place={Charlotte, NC, USA}, title={A Hybrid Coding Strategy for Optimized Test Data Compression}, DOI={10.1109/test.2003.1270870}, booktitle={IEEE International Test Conference (ITC’03)}, publisher={IEEE}, author={Wuertenberger, Armin and S. Tautermann, Christofer and Hellebrand, Sybille}, year={2003}, pages={451–459} }
LibreCat
| DOI
2002 | Misc | LibreCat-ID: 13097
@book{Hellebrand_Wuertenberger_2002, place={IEEE International Workshop on Test Resource Partitioning, Baltimore, MD, USA}, title={Alternating Run-Length Coding: A Technique for Improved Test Data Compression}, author={Hellebrand, Sybille and Wuertenberger, Armin}, year={2002} }
LibreCat
2002 | Journal Article | LibreCat-ID: 13003
@article{Hellebrand_Wunderlich_A. Ivaniuk_V. Klimets_N. Yarmolik_2002, title={Efficient Online and Offline Testing of Embedded DRAMs}, volume={51}, DOI={10.1109/tc.2002.1017700}, number={7}, journal={IEEE Transactions on Computers}, publisher={IEEE}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim and A. Ivaniuk, Alexander and V. Klimets, Yuri and N. Yarmolik, Vyacheslav}, year={2002}, pages={801–809} }
LibreCat
| DOI
2002 | Journal Article | LibreCat-ID: 13069
@article{Hellebrand_Liang_Wunderlich_2002, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, volume={18}, number={2}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, author={Hellebrand, Sybille and Liang, Hua-Guo and Wunderlich, Hans-Joachim}, year={2002}, pages={157–168} }
LibreCat
2002 | Journal Article | LibreCat-ID: 13070
@article{Liang_Hellebrand_Wunderlich_2002, title={A Mixed-Mode BIST Scheme Based on Folding Compression}, volume={17}, number={2}, journal={Journal on Computer Science and Technology}, author={Liang, Huaguo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2002}, pages={203–212} }
LibreCat
2001 | Misc | LibreCat-ID: 13096
@book{Liang_Hellebrand_Wunderlich_2001, place={IEEE European Test Workshop, Stockholm, Sweden}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001} }
LibreCat
2001 | Conference Paper | LibreCat-ID: 13004
@inproceedings{Liang_Hellebrand_Wunderlich_2001, place={Baltimore, MD, USA}, title={Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST}, DOI={10.1109/test.2001.966712}, booktitle={IEEE International Test Conference (ITC’01)}, publisher={IEEE}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={894–902} }
LibreCat
| DOI
2001 | Journal Article | LibreCat-ID: 13047
@article{Liang_Hellebrand_Wunderlich_2001, title={Deterministic BIST Scheme Based on Reseeding of Folding Counters}, volume={38}, number={8}, journal={Journal of Computer Research and Development, (Jisuanji Yanjiu yu Fazhan)}, author={Liang, Hua-Guo and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2001}, pages={931} }
LibreCat