Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

165 Publications


2010 | Conference Paper | LibreCat-ID: 13051
Hunger, Marc, and Sybille Hellebrand. “Ausbeute Und Fehlertoleranz Bei Dreifach Modularer Redundanz.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 81–88.
LibreCat
 

2010 | Misc | LibreCat-ID: 13073
Hellebrand, Sybille. Nano-Electronic Systems. 2010.
LibreCat
 

2010 | Conference Paper | LibreCat-ID: 12983
Hopsch, Fabian, et al. “Variation-Aware Fault Modeling.” 19th IEEE Asian Test Symposium (ATS’10), IEEE, 2010, pp. 87–93, doi:10.1109/ats.2010.24.
LibreCat | DOI
 

2010 | Conference Paper | LibreCat-ID: 12985
Indlekofer, Thomas, et al. “Efficient Test Response Compaction for Robust BIST Using Parity Sequences.” 28th IEEE International Conference on Computer Design (ICCD’10), IEEE, 2010, pp. 480–85, doi:10.1109/iccd.2010.5647648.
LibreCat | DOI
 

2010 | Conference Paper | LibreCat-ID: 12986
Hunger, Marc, and Sybille Hellebrand. “The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems.” 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10), IEEE, 2010, pp. 101–08, doi:10.1109/dft.2010.19.
LibreCat | DOI
 

2010 | Conference Paper | LibreCat-ID: 12988
Froese, Viktor, et al. “Reusing NoC-Infrastructure for Test Data Compression.” 28th IEEE VLSI Test Symposium (VTS’10), IEEE, 2010, pp. 227–31, doi:10.1109/vts.2010.5469570.
LibreCat | DOI
 

2010 | Conference Paper | LibreCat-ID: 13049
Becker, Bernd, et al. “Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits.” 4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper), 2010.
LibreCat
 

2010 | Conference Paper | LibreCat-ID: 13050
Indlekofer, Thomas, et al. “Robuster Selbsttest Mit Extremer Kompaktierung.” 4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2010, pp. 17–24.
LibreCat
 

2009 | Conference Paper | LibreCat-ID: 12991
Hunger, Marc, et al. “ATPG-Based Grading of Strong Fault-Secureness.” 15th IEEE International On-Line Testing Symposium (IOLTS’09, IEEE, 2009, doi:10.1109/iolts.2009.5196027.
LibreCat | DOI
 

2009 | Conference Paper | LibreCat-ID: 12990
Hellebrand, Sybille, and Marc Hunger. “Are Robust Circuits Really Robust?” 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk), IEEE, 2009, p. 77, doi:10.1109/dft.2009.28.
LibreCat | DOI
 

2009 | Conference Paper | LibreCat-ID: 13030
Hunger, Marc, et al. “Robustheitsanalyse Stark Fehlersicherer Schaltungen Mit SAT-Basierter Testmustererzeugung.” 3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2009.
LibreCat
 

2008 | Misc | LibreCat-ID: 13033
Coym, Torsten, et al. Ein Verfeinertes Elektrisches Modell Für Teilchentreffer Und Dessen Auswirkung Auf Die Bewertung Der Schaltungsempfindlichkeit. 2008.
LibreCat
 

2008 | Misc | LibreCat-ID: 13035
Amgalan, Uranmandakh, et al. Testen Mit Rücksetzpunkten - Ein Ansatz Zur Verbesserung Der Ausbeute Bei Robusten Schaltungen. 2008.
LibreCat
 

2008 | Conference Paper | LibreCat-ID: 12992
Oehler, Philipp, et al. “A Modular Memory BIST for Optimized Memory Repair.” 14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster), IEEE, 2008, doi:10.1109/iolts.2008.30.
LibreCat | DOI
 

2008 | Conference Paper | LibreCat-ID: 12994
Amgalan, Uranmandakh, et al. “Signature Rollback - A Technique for Testing Robust Circuits.” 26th IEEE VLSI Test Symposium (VTS’08), IEEE, 2008, pp. 125–30, doi:10.1109/vts.2008.34.
LibreCat | DOI
 

2008 | Conference Paper | LibreCat-ID: 12993
Hunger, Marc, and Sybille Hellebrand. “Verification and Analysis of Self-Checking Properties through ATPG.” 14th IEEE International On-Line Testing Symposium (IOLTS’08), IEEE, 2008, doi:10.1109/iolts.2008.32.
LibreCat | DOI
 

2008 | Conference Paper | LibreCat-ID: 13031
Hunger, Marc, and Sybille Hellebrand. “Analyse Selbstprüfender Schaltungen – Nachweis von Fehlersicherheit Und Selbsttestbarkeit Mit ATPG.” 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2008.
LibreCat
 

2008 | Conference Paper | LibreCat-ID: 13032
Oehler, Philipp, et al. “Modularer Selbsttest Und Optimierte Reparaturanalyse.” 2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2008.
LibreCat
 

2007 | Misc | LibreCat-ID: 13038
Hellebrand, Sybille. Reliable Nanoscale Systems - Challenges and Strategies for On- and Offline Testing. 2007.
LibreCat
 

2007 | Misc | LibreCat-ID: 13039
Ali, Muhammad, et al. An End-to-End Reliability Protocol to Address Transient Faults in Network on Chips. 2007.
LibreCat
 

2007 | Misc | LibreCat-ID: 13042
Oehler, Philipp, et al. An Integrated Built-in Test and Repair Approach for Memories with 2D Redundancy. 2007.
LibreCat
 

2007 | Misc | LibreCat-ID: 13043
Hellebrand, Sybille. Qualitätssicherung Für Nanochips - Wie IT-Produkte Zuverlässig Werden. 2007.
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 12995
Hellebrand, Sybille, et al. “A Refined Electrical Model for Particle Strikes and Its Impact on SEU Prediction.” 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07), IEEE, 2007, pp. 50–58, doi:10.1109/dft.2007.43.
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 12996
Oehler, Philipp, et al. “Analyzing Test and Repair Times for 2D Integrated Memory Built-in Test and Repair.” 10th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS’07), IEEE, 2007, pp. 185–90, doi:10.1109/ddecs.2007.4295278.
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 12997
Oehler, Philipp, et al. “An Integrated Built-In Test and Repair Approach for Memories with 2D Redundancy.” 12th IEEE European Test Symposium (ETS’07), IEEE, 2007, pp. 91–96, doi:10.1109/ets.2007.10.
LibreCat | DOI
 

2007 | Conference Paper | LibreCat-ID: 13037
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” 43rd International Conference on Microelectronics, Devices and Material with the Workshop on Electronic Testing (MIDEM’07), (Invited Paper), 2007.
LibreCat
 

2007 | Journal Article | LibreCat-ID: 13036
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper), vol. 37, no. 4 (124), 2007, pp. 212–19.
LibreCat
 

2007 | Journal Article | LibreCat-ID: 13044
Ali, Muhammad, et al. “An Efficient Fault Tolerant Mechanism to Deal with Permanent and Transient Failures in a Network on Chip.” International Journal on High Performance Systems Architecture, vol. 1, no. 2, 2007, pp. 113–23.
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 13040
Ali, Muhammad, et al. “A Fault Tolerant Mechanism for Handling Permanent and Transient Failures in a Network on Chip.” 4th International Conference on Information Technology: New Generations (ITNG’07), 2007, pp. 1027–32.
LibreCat
 

2007 | Conference Paper | LibreCat-ID: 13041
Becker, Bernd, et al. “Test Und Zuverlässigkeit Nanoelektronischer Systeme.” 1. GMM/GI/ITG-Fachtagung “Zuverlässigkeit Und Entwurf,” 2007.
LibreCat
 

2006 | Journal Article | LibreCat-ID: 13045
Becker, Bernd, et al. “DFG-Projekt RealTest - Test Und Zuverlässigkeit Nanoelektronischer Systeme.” It - Information Technology, vol. 48, no. 5, 2006, pp. 305–11.
LibreCat
 

2005 | Misc | LibreCat-ID: 13046
Oehler, Philipp, and Sybille Hellebrand. A Low Power Design for Embedded DRAMs with Online Consistency Checking. 2005.
LibreCat
 

2005 | Misc | LibreCat-ID: 13101
Ali, Muhammad, et al. Dynamic Routing: A Prerequisite for Reliable NoCs. 2005.
LibreCat
 

2005 | Misc | LibreCat-ID: 13102
Oehler, Philipp, and Sybille Hellebrand. Power Consumption Versus Error Correcting Capabilities in Embedded DRAMs - A Case Study. 2005.
LibreCat
 

2005 | Conference Paper | LibreCat-ID: 12999
Ali, Muhammad, et al. “Considerations for Fault-Tolerant Networks on Chips.” IEEE International Conference on Microelectronics (ICM’05), IEEE, 2005, doi:10.1109/icm.2005.1590063.
LibreCat | DOI
 

2005 | Conference Paper | LibreCat-ID: 13000
Oehler, Philipp, and Sybille Hellebrand. “Low Power Embedded DRAMs with High Quality Error Correcting Capabilities.” 10th IEEE European Test Symposium (ETS’05), IEEE, 2005, pp. 148–53, doi:10.1109/ets.2005.28.
LibreCat | DOI
 

2005 | Conference Paper | LibreCat-ID: 12998
Ali, Muhammad, et al. “A Dynamic Routing Mechanism for Network on Chip.” 23rd IEEE NORCHIP Conference, IEEE, 2005, pp. 70–73, doi:10.1109/norchp.2005.1596991.
LibreCat | DOI
 

2004 | Conference Paper | LibreCat-ID: 13071
Liu Jing, Michelle, et al. “Sensor Networks with More Features Using Less Hardware.” {GOR/NGB Conference Tilburg 2004}, 2004.
LibreCat
 

2004 | Misc | LibreCat-ID: 13099
Breu, Ruth, et al. Im Westen Viel Neues - Informatik an Der Universität Innsbruck. 2004.
LibreCat
 

2004 | Misc | LibreCat-ID: 13100
Hellebrand, Sybille, et al. Data Compression for Multiple Scan Chains Using Dictionaries with Corrections. 2004.
LibreCat
 

2004 | Conference Paper | LibreCat-ID: 13001
Wuertenberger, Armin, et al. “Data Compression for Multiple Scan Chains Using Dictionaries with Corrections.” IEEE International Test Conference (ITC’04), IEEE, 2004, pp. 926–35, doi:10.1109/test.2004.1387357.
LibreCat | DOI
 

2003 | Misc | LibreCat-ID: 13098
Breu, Ruth, et al. Experiences from Teaching Software Development in a Java Environment. 2003.
LibreCat
 

2003 | Conference Paper | LibreCat-ID: 13002
Wuertenberger, Armin, et al. “A Hybrid Coding Strategy for Optimized Test Data Compression.” IEEE International Test Conference (ITC’03), IEEE, 2003, pp. 451–59, doi:10.1109/test.2003.1270870.
LibreCat | DOI
 

2002 | Misc | LibreCat-ID: 13097
Hellebrand, Sybille, and Armin Wuertenberger. Alternating Run-Length Coding: A Technique for Improved Test Data Compression. 2002.
LibreCat
 

2002 | Journal Article | LibreCat-ID: 13003
Hellebrand, Sybille, et al. “Efficient Online and Offline Testing of Embedded DRAMs.” IEEE Transactions on Computers, vol. 51, no. 7, IEEE, 2002, pp. 801–09, doi:10.1109/tc.2002.1017700.
LibreCat | DOI
 

2002 | Journal Article | LibreCat-ID: 13069
Hellebrand, Sybille, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” Journal of Electronic Testing - Theory and Applications (JETTA), vol. 18, no. 2, 2002, pp. 157–68.
LibreCat
 

2002 | Journal Article | LibreCat-ID: 13070
Liang, Huaguo, et al. “A Mixed-Mode BIST Scheme Based on Folding Compression.” Journal on Computer Science and Technology, vol. 17, no. 2, 2002, pp. 203–12.
LibreCat
 

2001 | Misc | LibreCat-ID: 13096
Liang, Hua-Guo, et al. Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST. 2001.
LibreCat
 

2001 | Conference Paper | LibreCat-ID: 13004
Liang, Hua-Guo, et al. “Two-Dimensional Test Data Compression for Scan-Based Deterministic BIST.” IEEE International Test Conference (ITC’01), IEEE, 2001, pp. 894–902, doi:10.1109/test.2001.966712.
LibreCat | DOI
 

2001 | Journal Article | LibreCat-ID: 13047
Liang, Hua-Guo, et al. “Deterministic BIST Scheme Based on Reseeding of Folding Counters.” Journal of Computer Research and Development, (Jisuanji Yanjiu Yu Fazhan), vol. 38, no. 8, 2001, p. 931.
LibreCat
 

Filters and Search Terms

department=48

Search

Filter Publications

Display / Sort

Citation Style: MLA

Export / Embed