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136 Publications


2019 | Misc | LibreCat-ID: 8112
@book{Maaz_Sprenger_Hellebrand_2019, place={Prien am Chiemsee}, title={A Hybrid Space Compactor for Varying X-Rates}, publisher={31. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’19)}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019} }
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2019 | Journal Article | LibreCat-ID: 8667
@article{Sprenger_Hellebrand_2019, title={Divide and Compact - Stochastic Space Compaction for Faster-than-At-Speed Test}, volume={28}, DOI={10.1142/s0218126619400012}, number={1}, journal={Journal of Circuits, Systems and Computers}, publisher={World Scientific Publishing Company}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–23} }
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2019 | Conference Paper | LibreCat-ID: 12918
@inproceedings{Maaz_Sprenger_Hellebrand_2019, place={Washington, DC, USA}, title={A Hybrid Space Compactor for Adaptive X-Handling}, booktitle={50th IEEE International Test Conference (ITC)}, publisher={IEEE}, author={Maaz, Mohammad Urf and Sprenger, Alexander and Hellebrand, Sybille}, year={2019}, pages={1–8} }
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2019 | Journal Article | LibreCat-ID: 13048
@article{Kampmann_A. Kochte_Liu_Schneider_Hellebrand_Wunderlich_2019, title={Built-in Test for Hidden Delay Faults}, volume={38}, number={10}, journal={IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Schneider, Eric and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2019}, pages={1956–1968} }
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2018 | Misc | LibreCat-ID: 4576
@book{Sprenger_Hellebrand_2018, place={Freiburg, Germany}, title={Stochastische Kompaktierung für den Hochgeschwindigkeitstest}, publisher={30. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’18)}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
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2018 | Journal Article | LibreCat-ID: 13057
@article{Kampmann_Hellebrand_2018, title={Design For Small Delay Test - A Simulation Study}, volume={80}, journal={Microelectronics Reliability}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018}, pages={124–133} }
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2018 | Misc | LibreCat-ID: 13072
@book{Kampmann_Hellebrand_2018, place={19th Workshop on RTL and High Level Testing (WRTLT’18), Hefei, Anhui, China}, title={Optimized Constraints for Scan-Chain Insertion for Faster-than-at-Speed Test}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2018} }
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2018 | Journal Article | LibreCat-ID: 12974
@article{Hellebrand_Henkel_Raghunathan_Wunderlich_2018, title={Guest Editors’ Introduction - Special Issue on Approximate Computing}, volume={10}, DOI={10.1109/les.2018.2789942}, number={1}, journal={IEEE Embedded Systems Letters}, publisher={IEEE}, author={Hellebrand, Sybille and Henkel, Joerg and Raghunathan, Anand and Wunderlich, Hans-Joachim}, year={2018}, pages={1–1} }
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2018 | Conference Paper | LibreCat-ID: 10575
@inproceedings{Liu_Schneider_Kampmann_Hellebrand_Wunderlich_2018, title={Extending Aging Monitors for Early Life and Wear-Out Failure Prevention}, DOI={10.1109/ats.2018.00028}, booktitle={2018 IEEE 27th Asian Test Symposium (ATS)}, author={Liu, Chang and Schneider, Eric and Kampmann, Matthias and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2018} }
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2018 | Conference Paper | LibreCat-ID: 4575
@inproceedings{Sprenger_Hellebrand_2018, place={Budapest}, title={Tuning Stochastic Space Compaction to Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2018.00020}, booktitle={2018 IEEE 21st International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Sprenger, Alexander and Hellebrand, Sybille}, year={2018} }
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2017 | Conference Paper | LibreCat-ID: 10576
@inproceedings{Kampmann_Hellebrand_2017, title={Design-for-FAST: Supporting X-tolerant compaction during Faster-than-at-Speed Test}, DOI={10.1109/ddecs.2017.7934564}, booktitle={2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
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2017 | Conference Paper | LibreCat-ID: 12973
@inproceedings{Deshmukh_Kunz_Wunderlich_Hellebrand_2017, place={Caesars Palace, Las Vegas, Nevada, USA}, title={Special Session on Early Life Failures}, DOI={10.1109/vts.2017.7928933}, booktitle={35th IEEE VLSI Test Symposium (VTS’17)}, publisher={IEEE}, author={Deshmukh, Jyotirmoy and Kunz, Wolfgang and Wunderlich, Hans-Joachim and Hellebrand, Sybille}, year={2017} }
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2017 | Misc | LibreCat-ID: 13078
@book{Kampmann_Hellebrand_2017, place={29. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’17), Lübeck, Germany}, title={X-tolerante Prüfzellengruppierung für den Test mit erhöhter Betriebsfrequenz}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2017} }
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2016 | Conference Paper | LibreCat-ID: 12975
@inproceedings{Kampmann_Hellebrand_2016, place={Hiroshima, Japan}, title={X Marks the Spot: Scan-Flip-Flop Clustering for Faster-than-at-Speed Test}, DOI={10.1109/ats.2016.20}, booktitle={25th IEEE Asian Test Symposium (ATS’16)}, publisher={IEEE}, author={Kampmann, Matthias and Hellebrand, Sybille}, year={2016}, pages={1–6} }
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2015 | Conference Paper | LibreCat-ID: 12976
@inproceedings{Kampmann_A. Kochte_Schneider_Indlekofer_Hellebrand_Wunderlich_2015, place={Mumbai, India}, title={Optimized Selection of Frequencies for Faster-Than-at-Speed Test}, DOI={10.1109/ats.2015.26}, booktitle={24th IEEE Asian Test Symposium (ATS’15)}, publisher={IEEE}, author={Kampmann, Matthias and A. Kochte, Michael and Schneider, Eric and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2015}, pages={109–114} }
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2015 | Journal Article | LibreCat-ID: 13056
@article{Huang_Liang_Hellebrand_2015, title={A High Performance SEU Tolerant Latch}, volume={31}, number={4}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Huang, Zhengfeng and Liang, Huaguo and Hellebrand, Sybille}, year={2015}, pages={349–359} }
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2015 | Misc | LibreCat-ID: 13077
@book{Hellebrand_Indlekofer_Kampmann_Kochte_Liu_Wunderlich_2015, place={27. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’15), Bad Urach, Germany}, title={Effiziente Auswahl von Testfrequenzen für den Test kleiner Verzögerungsfehler}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2015} }
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2014 | Conference Paper | LibreCat-ID: 12977
@inproceedings{Hellebrand_Indlekofer_Kampmann_A. Kochte_Liu_Wunderlich_2014, place={Seattle, Washington, USA}, title={FAST-BIST: Faster-than-at-Speed BIST Targeting Hidden Delay Defects}, DOI={10.1109/test.2014.7035360}, booktitle={IEEE International Test Conference (ITC’14)}, publisher={IEEE}, author={Hellebrand, Sybille and Indlekofer, Thomas and Kampmann, Matthias and A. Kochte, Michael and Liu, Chang and Wunderlich, Hans-Joachim}, year={2014} }
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2014 | Journal Article | LibreCat-ID: 13054
@article{Hellebrand_Wunderlich_2014, title={SAT-Based ATPG beyond Stuck-at Fault Testing}, volume={56}, number={4}, journal={DeGruyter Journal on Information Technology (it)}, publisher={DeGruyter}, author={Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={165–172} }
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2014 | Journal Article | LibreCat-ID: 13055
@article{Rodriguez Gomez_Cook_Indlekofer_Hellebrand_Wunderlich_2014, title={Adaptive Bayesian Diagnosis of Intermittent Faults}, volume={30}, number={5}, journal={Journal of Electronic Testing - Theory and Applications (JETTA)}, publisher={Springer}, author={Rodriguez Gomez, Laura and Cook, Alejandro and Indlekofer, Thomas and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2014}, pages={527–540} }
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2013 | Misc | LibreCat-ID: 13075
@book{Cook_Rodriguez Gomez_Hellebrand_Indlekofer_Wunderlich_2013, place={14th Latin American Test Workshop, Cordoba, Argentina}, title={Adaptive Test and Diagnosis of Intermittent Faults}, author={Cook, Alejandro and Rodriguez Gomez, Laura and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2013} }
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2013 | Conference Paper | LibreCat-ID: 12979
@inproceedings{Hellebrand_2013, place={Cordoba, Argentina}, title={Analyzing and Quantifying Fault Tolerance Properties}, DOI={10.1109/latw.2013.6562662}, booktitle={14th IEEE Latin American Test Workshop - (LATW’13)}, publisher={IEEE}, author={Hellebrand, Sybille}, year={2013} }
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2012 | Conference Paper | LibreCat-ID: 12980
@inproceedings{Cook_Hellebrand_E. Imhof_Mumtaz_Wunderlich_2012, place={Quito, Ecuador}, title={Built-in Self-Diagnosis Targeting Arbitrary Defects with Partial Pseudo-Exhaustive Test}, DOI={10.1109/latw.2012.6261229}, booktitle={13th IEEE Latin American Test Workshop (LATW’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and E. Imhof, Michael and Mumtaz, Abdullah and Wunderlich, Hans-Joachim}, year={2012}, pages={1–4} }
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2012 | Conference Paper | LibreCat-ID: 12981
@inproceedings{Cook_Hellebrand_Wunderlich_2012, place={Annecy, France}, title={Built-in Self-Diagnosis Exploiting Strong Diagnostic Windows in Mixed-Mode Test}, DOI={10.1109/ets.2012.6233025}, booktitle={17th IEEE European Test Symposium (ETS’12)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012}, pages={1–6} }
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2012 | Misc | LibreCat-ID: 13074
@book{Cook_Hellebrand_Wunderlich_2012, place={24. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’12), Cottbus, Germany}, title={Eingebaute Selbstdiagnose mit zufälligen und deterministischen Mustern}, author={Cook, Alejandro and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2012} }
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2011 | Conference Paper | LibreCat-ID: 12984
@inproceedings{Polian_Becker_Hellebrand_Wunderlich_Maxwell_2011, place={Trondheim, Norway}, title={Towards Variation-Aware Test Methods}, DOI={10.1109/ets.2011.51}, booktitle={16th IEEE European Test Symposium Trondheim (ETS’11)}, publisher={IEEE}, author={Polian, Ilia and Becker, Bernd and Hellebrand, Sybille and Wunderlich, Hans-Joachim and Maxwell, Peter}, year={2011} }
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2011 | Journal Article | LibreCat-ID: 13052
@article{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2011, title={Variation-Aware Fault Modeling}, volume={54}, number={4}, journal={{SCIENCE CHINA Information Sciences, Science China Press, co-published with Springer}}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2011}, pages={1813–1826} }
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2011 | Conference Paper | LibreCat-ID: 13053
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={Hamburg, Germany}, title={Robuster Selbsttest mit Diagnose}, booktitle={5. GMM/GI/ITG Fachtagung “Zuverlässigkeit und Entwurf”}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={48–53} }
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2011 | Conference Paper | LibreCat-ID: 12982
@inproceedings{Cook_Hellebrand_Indlekofer_Wunderlich_2011, place={New Delhi, India}, title={Diagnostic Test of Robust Circuits}, DOI={10.1109/ats.2011.55}, booktitle={20th IEEE Asian Test Symposium (ATS’11)}, publisher={IEEE}, author={Cook, Alejandro and Hellebrand, Sybille and Indlekofer, Thomas and Wunderlich, Hans-Joachim}, year={2011}, pages={285–290} }
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2010 | Conference Paper | LibreCat-ID: 12983
@inproceedings{Hopsch_Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Shanghai, China}, title={Variation-Aware Fault Modeling}, DOI={10.1109/ats.2010.24}, booktitle={{19th IEEE Asian Test Symposium (ATS’10)}}, publisher={{IEEE}}, author={Hopsch, Fabian and Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010}, pages={87–93} }
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2010 | Conference Paper | LibreCat-ID: 12988
@inproceedings{Froese_Ibers_Hellebrand_2010, place={Santa Cruz, CA, USA}, title={Reusing NoC-Infrastructure for Test Data Compression}, DOI={10.1109/vts.2010.5469570}, booktitle={{28th IEEE VLSI Test Symposium (VTS’10)}}, publisher={{IEEE}}, author={Froese, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010}, pages={227–231} }
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2010 | Conference Paper | LibreCat-ID: 13049
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, booktitle={{4th Workshop on Dependable and Secure Nanocomputing (WDSN’10), (Invited Paper)}}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
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2010 | Conference Paper | LibreCat-ID: 13051
@inproceedings{Hunger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Ausbeute und Fehlertoleranz bei dreifach modularer Redundanz}, booktitle={4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={81–88} }
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2010 | Conference Paper | LibreCat-ID: 12985
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Amsterdam, The Netherlands}, title={Efficient Test Response Compaction for Robust BIST Using Parity Sequences}, DOI={10.1109/iccd.2010.5647648}, booktitle={{28th IEEE International Conference on Computer Design (ICCD’10)}}, publisher={{IEEE}}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={480–485} }
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2010 | Misc | LibreCat-ID: 10670
@book{Fröse_Ibers_Hellebrand_2010, place={22. Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (TuZ’10), Paderborn, Germany}, title={Testdatenkompression mit Hilfe der Netzwerkinfrastruktur}, author={Fröse, Viktor and Ibers, Rüdiger and Hellebrand, Sybille}, year={2010} }
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2010 | Conference Paper | LibreCat-ID: 12986
@inproceedings{Hunger_Hellebrand_2010, place={Kyoto, Japan}, title={The Impact of Manufacturing Defects on the Fault Tolerance of TMR-Systems}, DOI={10.1109/dft.2010.19}, booktitle={{25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’10)}}, publisher={{IEEE}}, author={Hunger, Marc and Hellebrand, Sybille}, year={2010}, pages={101–108} }
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2010 | Misc | LibreCat-ID: 13073
@book{Hellebrand_2010, place={Editorial, it 4/2010, pp. 179-180}, title={Nano-Electronic Systems}, author={Hellebrand, Sybille}, year={2010} }
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2010 | Conference Paper | LibreCat-ID: 12987
@inproceedings{Becker_Hellebrand_Polian_Straube_Vermeiren_Wunderlich_2010, place={Chicago, IL, USA}, title={Massive Statistical Process Variations - A Grand Challenge for Testing Nanoelectronic Circuits}, DOI={10.1109/dsnw.2010.5542612}, booktitle={40th Annual IEEE/IFIP International Conference on Dependable Systems and Networks Workshops (DSN-W’10)}, publisher={IEEE}, author={Becker, Bernd and Hellebrand, Sybille and Polian, Ilia and Straube, Bernd and Vermeiren, Wolfgang and Wunderlich, Hans-Joachim}, year={2010} }
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2010 | Conference Paper | LibreCat-ID: 13050
@inproceedings{Indlekofer_Schnittger_Hellebrand_2010, place={Wildbad Kreuth, Germany}, title={Robuster Selbsttest mit extremer Kompaktierung}, booktitle={{4. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}}, author={Indlekofer, Thomas and Schnittger, Michael and Hellebrand, Sybille}, year={2010}, pages={17–24} }
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2009 | Conference Paper | LibreCat-ID: 12990
@inproceedings{Hellebrand_Hunger_2009, place={Chicago, IL, USA}, title={Are Robust Circuits Really Robust?}, DOI={10.1109/dft.2009.28}, booktitle={{24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT’09), (Invited Talk)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and Hunger, Marc}, year={2009}, pages={77} }
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2009 | Conference Paper | LibreCat-ID: 12991
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Sesimbra-Lisbon, Portugal}, title={ATPG-Based Grading of Strong Fault-Secureness}, DOI={10.1109/iolts.2009.5196027}, booktitle={{15th IEEE International On-Line Testing Symposium (IOLTS’09)}}, publisher={{IEEE}}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alejandro and Polian, Ilia and Becker, Bernd}, year={2009} }
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2009 | Conference Paper | LibreCat-ID: 13030
@inproceedings{Hunger_Hellebrand_Czutro_Polian_Becker_2009, place={Stuttgart, Germany}, title={Robustheitsanalyse stark fehlersicherer Schaltungen mit SAT-basierter Testmustererzeugung}, booktitle={{3. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}}, author={Hunger, Marc and Hellebrand, Sybille and Czutro, Alexander and Polian, Ilia and Becker, Bernd}, year={2009} }
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2008 | Conference Paper | LibreCat-ID: 13032
@inproceedings{Oehler_Bosio_Di Natale_Hellebrand_2008, place={Ingolstadt, Germany}, title={Modularer Selbsttest und optimierte Reparaturanalyse}, booktitle={{2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}}, author={Oehler, Philipp and Bosio, Alberto and Di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
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2008 | Misc | LibreCat-ID: 13033
@book{Coym_Hellebrand_Ludwig_Straube_Wunderlich_G. Zoellin_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen” (Poster), Wien, Österreich}, title={Ein verfeinertes elektrisches Modell für Teilchentreffer und dessen Auswirkung auf die Bewertung der Schaltungsempfindlichkeit}, author={Coym, Torsten and Hellebrand, Sybille and Ludwig, Stefan and Straube, Bernd and Wunderlich, Hans-Joachim and G. Zoellin, Christian}, year={2008} }
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2008 | Conference Paper | LibreCat-ID: 12992
@inproceedings{Oehler_Bosio_di Natale_Hellebrand_2008, place={Rhodos, Greece}, title={A Modular Memory BIST for Optimized Memory Repair}, DOI={10.1109/iolts.2008.30}, booktitle={{14th IEEE International On-Line Testing Symposium (IOLTS’08), (Poster)}}, publisher={{IEEE}}, author={Oehler, Philipp and Bosio, Alberto and di Natale, Giorgio and Hellebrand, Sybille}, year={2008} }
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2008 | Conference Paper | LibreCat-ID: 12993
@inproceedings{Hunger_Hellebrand_2008, place={Rhodos, Greece}, title={Verification and Analysis of Self-Checking Properties through ATPG}, DOI={10.1109/iolts.2008.32}, booktitle={{14th IEEE International On-Line Testing Symposium (IOLTS’08)}}, publisher={{IEEE}}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
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2008 | Misc | LibreCat-ID: 13035
@book{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={20. ITG/GI/GMM Workshop “Testmethoden und Zuverlässigkeit von Schaltungen und Systemen”, Wien, Österreich}, title={Testen mit Rücksetzpunkten - ein Ansatz zur Verbesserung der Ausbeute bei robusten Schaltungen}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008} }
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2008 | Conference Paper | LibreCat-ID: 12994
@inproceedings{Amgalan_Hachmann_Hellebrand_Wunderlich_2008, place={San Diego, CA, USA}, title={Signature Rollback - A Technique for Testing Robust Circuits}, DOI={10.1109/vts.2008.34}, booktitle={{26th IEEE VLSI Test Symposium (VTS’08)}}, publisher={{IEEE}}, author={Amgalan, Uranmandakh and Hachmann, Christian and Hellebrand, Sybille and Wunderlich, Hans-Joachim}, year={2008}, pages={125–130} }
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2008 | Conference Paper | LibreCat-ID: 13031
@inproceedings{Hunger_Hellebrand_2008, place={Ingolstadt, Germany}, title={Analyse selbstprüfender Schaltungen – Nachweis von Fehlersicherheit und Selbsttestbarkeit mit ATPG}, booktitle={{2. GMM/GI/ITG-Fachtagung “Zuverlässigkeit und Entwurf”}}, author={Hunger, Marc and Hellebrand, Sybille}, year={2008} }
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2007 | Conference Paper | LibreCat-ID: 12995
@inproceedings{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, place={Rome, Italy}, title={A Refined Electrical Model for Particle Strikes and its Impact on SEU Prediction}, DOI={10.1109/dft.2007.43}, booktitle={{22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT’07)}}, publisher={{IEEE}}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={50–58} }
LibreCat | DOI
 

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