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29 Publications


2023 | Special Issue | LibreCat-ID: 49367 | OA
Self-Assembled Block Copolymer Thin Films and Their Applications
J. Lindner, K. Brassat, eds., Self-Assembled Block Copolymer Thin Films and Their Applications, 2023.
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2023 | Journal Article | LibreCat-ID: 51368
Does Explainability Require Transparency?
E. Esposito, Sociologica 16 (2023) 17–27.
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2023 | Journal Article | LibreCat-ID: 51369 LibreCat | DOI
 

2022 | Journal Article | LibreCat-ID: 33669 | OA
End-to-End Dereverberation, Beamforming, and Speech Recognition in A Cocktail Party
W. Zhang, X. Chang, C. Boeddeker, T. Nakatani, S. Watanabe, Y. Qian, IEEE/ACM Transactions on Audio, Speech, and Language Processing (2022).
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2022 | Journal Article | LibreCat-ID: 49172 | OA
Auswirkung der Theologie auf das rechtsphilosophische Denken der Muʿtazila: Lektüre bei al-Qāḍī ʿAbd al-Ǧabbār
M. Abdelrahem, Zeitschrift für Recht und Islam / Journal of Law & Islam (2022) 57–80.
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2020 | Journal Article | LibreCat-ID: 23517
The new V-Model of 2206 and its validation
I. Gräßler, J. Hentze, At-Automatisierungstechnik 68(5) (2020) 312–324.
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2020 | Journal Article | LibreCat-ID: 21796
Two-dimensional electron bound hole photoluminescence in GaAs in perpendicular magnetic fields
J. Schuster, T.Y. Kim, E. Batke, D. Reuter, A.D. Wieck, Semiconductor Science and Technology (2020).
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2020 | Book Review | LibreCat-ID: 21294 | OA
Review Hagengruber Le Ru Émilie Du Châtelet Philosophe
R. Hagengruber, H-France Net 158 (2020).
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2020 | Journal Article | LibreCat-ID: 33299 | OA LibreCat | Files available | Download (ext.)
 

2020 | Book Review | LibreCat-ID: 51816
Rezension zu: Bernardo Bátiz-Lazo: Cash and Dash. How ATMs and Computers Changed Banking
M. Schmitt, Vierteljahrschrift Für Sozial- Und Wirtschaftsgeschichte 107 (2020) 541–543.
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2019 | Journal Article | LibreCat-ID: 12930
High-precision determination of silicon nanocrystals: optical spectroscopy versus electron microscopy
R. Köthemann, N. Weber, J.K.N. Lindner, C. Meier, Semiconductor Science and Technology 34 (2019).
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2019 | Journal Article | LibreCat-ID: 18125
Narratives of Vicarious Experience in Oral History Interviews with Craft Artists
J. Mildorf, Journal of Pragmatics 152 (2019) 103–112.
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2018 | Journal Article | LibreCat-ID: 19215
Structural, electronic and phononic properties of PtSe2: from monolayer to bulk
A. Kandemir, B. Akbali, Z. Kahraman, S.V. Badalov, M. Ozcan, F. Iyikanat, H. Sahin, Semiconductor Science and Technology (2018).
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2018 | Journal Article | LibreCat-ID: 7009
Interlayer charge transfer in n-modulation doped Al1−x Ga x As–GaAs single heterostructures
J. Schuster, T.Y. Kim, E. Batke, D. Reuter, A.D. Wieck, Semiconductor Science and Technology 33 (2018).
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2016 | Book | LibreCat-ID: 27390
Zwischen Wissenschaft und Lebenswelt. Entwicklung, Stand und Zukunftsperspektiven haushaltsbezogener Bildung.
K. Schlegel-Matthies, Zwischen Wissenschaft und Lebenswelt. Entwicklung, Stand und Zukunftsperspektiven haushaltsbezogener Bildung., 2016.
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2013 | Journal Article | LibreCat-ID: 7282
Influence of recombination center interaction on the photoluminescence of AlGaAs/GaAs heterostructures
J. Schuster, T.Y. Kim, E. Batke, D. Reuter, A.D. Wieck, Semiconductor Science and Technology 28 (2013).
LibreCat | DOI
 

2013 | Journal Article | LibreCat-ID: 7295
On the annealing mechanism of AuGe/Ni/Au ohmic contacts to a two-dimensional electron gas in GaAs/AlxGa1−xAs heterostructures
E.J. Koop, M.J. Iqbal, F. Limbach, M. Boute, B.J. van Wees, D. Reuter, A.D. Wieck, B.J. Kooi, C.H. van der Wal, Semiconductor Science and Technology 28 (2013).
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2011 | Journal Article | LibreCat-ID: 4545
In situ characterization of ZnTe epilayer irradiation via time-resolved and power-density-dependent Raman spectroscopy
V. Wiedemeier, G. Berth, A. Zrenner, E.M. Larramendi, U. Woggon, K. Lischka, D. Schikora, Semiconductor Science and Technology 26 (2011).
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2011 | Journal Article | LibreCat-ID: 42728 | OA
Como podemos definir vigilância?
C. Fuchs, MATRIZes 5 (2011) 109–133.
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2010 | Journal Article | LibreCat-ID: 4549
Intensity enhancement of Te Raman modes by laser damage in ZnTe epilayers
E.M. Larramendi, G. Berth, V. Wiedemeier, K.-P. Hüsch, A. Zrenner, U. Woggon, E. Tschumak, K. Lischka, D. Schikora, Semiconductor Science and Technology 25 (2010).
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2005 | Journal Article | LibreCat-ID: 21219
Mischbauweise sorgt für frischen Wind
G. Meschut, Konstruktion 04 (2005) 92–93.
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2005 | Journal Article | LibreCat-ID: 8693
Preparation of electron waveguide devices on GaAs/AlGaAs using negative-tone resist calixarene
M. Knop, M. Richter, R. Maßmann, U. Wieser, U. Kunze, D. Reuter, C. Riedesel, A.D. Wieck, Semiconductor Science and Technology (2005) 814–818.
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2004 | Journal Article | LibreCat-ID: 8692
Dual-gate GaAs/AlGaAs quantum point contact with tuneable subband energy separation
D. Kähler, M. Knop, U. Kunze, D. Reuter, A.D. Wieck, Semiconductor Science and Technology (2004) 140–143.
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2002 | Journal Article | LibreCat-ID: 21050
Lipirea în combinatie cu îmbinarile obtinute prin deformare
O. Hahn, M. Koyro, G. Meschut, Sudura 2 (2002) 10–13.
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2002 | Journal Article | LibreCat-ID: 8747
Layer-compensated selectively doped AlxGa1-xAs/GaAs heterostructures as a base material for nanolithography
D. Reuter, D. Kähler, U. Kunze, A.D. Wieck, Semiconductor Science and Technology (2002) 603–607.
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2002 | Journal Article | LibreCat-ID: 8768
Layer-compensated selectively doped AlxGa1-xAs/GaAs heterostructures as a base material for nanolithography
D. Reuter, D. Kähler, U. Kunze, A.D. Wieck, Semiconductor Science and Technology (2002) 603–607.
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2001 | Conference Paper | LibreCat-ID: 21009
Hybridfügen – Grundlagen, Technologie, Anwendungen
G. Meschut, in: DVM-Bericht 668, Berlin, 2001, pp. 119–134.
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2000 | Book (Editor) | LibreCat-ID: 18121
Medienbildung und Gesellschaft
J. Fromme, S. Ganguin, S. Iske, D.M. Meister, U. Sander, eds., Medienbildung und Gesellschaft, VS Verlag, 2000.
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1999 | Conference Paper | LibreCat-ID: 20992
Eine quasistationäre Meßmethode zur Ermittlung der Wärmeleitfähigkeit polymerer Zwischenschichten in Abhängigkeit von der Temperatur
M. Koyro, G. Meschut, in: Tagungsband Zur Veranstaltung Werkstoffprüfung 1999, 1999, pp. 173–184.
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