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1 Publication


2013 | Journal Article | LibreCat-ID: 7286
Grazing-incidence X-ray diffraction of single GaAs nanowires at locations defined by focused ion beams
G. Bussone, R. Schott, A. Biermanns, A. Davydok, D. Reuter, G. Carbone, T.U. Schülli, A.D. Wieck, U. Pietsch, Journal of Applied Crystallography 46 (2013) 887–892.
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