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1 Publication


2024 | Journal Article | LibreCat-ID: 54647
Estimation of losses caused by sidewall roughness in thin-film lithium niobate rib and strip waveguides
M. Hammer, S. Babel, H. Farheen, L. Padberg, J.C. Scheytt, C. Silberhorn, J. Förstner, Opt. Express 32 (2024) 22878–22891.
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