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1 Publication
2008 | Journal Article | LibreCat-ID: 4555
Panfilova, M., A. Pawlis, C. Arens, S. Michaelis de Vasconcellos, Gerhard Berth, K.P. Hüsch, V. Wiedemeier, Artur Zrenner, and K. Lischka. “Micro-Raman Imaging and Micro-Photoluminescence Measurements of Strain in ZnMgSe/ZnSe Microdiscs.” Microelectronics Journal 40, no. 2 (2008): 221–23. https://doi.org/10.1016/j.mejo.2008.07.056.
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