Please note that LibreCat no longer supports Internet Explorer versions 8 or 9 (or earlier).

We recommend upgrading to the latest Internet Explorer, Google Chrome, or Firefox.

4 Publications


2023 | Journal Article | LibreCat-ID: 48063
P. Arias-Cabarcos, M. Fallahi, T. Habrich, K. Schulze, C. Becker, and T. Strufe, “Performance and Usability Evaluation of Brainwave Authentication Techniques with Consumer Devices,” ACM Transactions on Privacy and Security, vol. 26, no. 3, pp. 1–36, 2023, doi: 10.1145/3579356.
LibreCat | DOI
 

2023 | Journal Article | LibreCat-ID: 48058
F. Winkel, J. Deuse-Kleinsteuber, and J. Böcker, “Run-to-Failure Relay Dataset for Predictive Maintenance Research With Machine Learning,” IEEE Transactions on Reliability, pp. 1–14, 2023, doi: 10.1109/tr.2023.3255786.
LibreCat | DOI
 

2022 | Journal Article | LibreCat-ID: 31844
A. Fischer, B. Fuhry, J. Kußmaul, J. Janneck, F. Kerschbaum, and E. Bodden, “Computation on Encrypted Data Using Dataflow Authentication,” ACM Transactions on Privacy and Security, vol. 25, no. 3, pp. 1–36, 2022, doi: 10.1145/3513005.
LibreCat | DOI
 

2014 | Journal Article | LibreCat-ID: 39483
F. F. Vidor, G. I. Wirth, and U. Hilleringmann, “Low temperature fabrication of a ZnO nanoparticle thin-film transistor suitable for flexible electronics,” Microelectronics Reliability, vol. 54, no. 12, pp. 2760–2765, 2014, doi: 10.1016/j.microrel.2014.07.147.
LibreCat | DOI
 

Filters and Search Terms

keyword="Reliability and Quality"

Search

Filter Publications

Display / Sort

Citation Style: IEEE

Export / Embed