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1355 Publications
2011 | Misc | LibreCat-ID: 42854
K. Kraft, ‚Glamour und Grauen. Das Erforschen und Ausstellen von Bekleidung aus den 1930er und 1940er Jahren’. in: …textil… 1/2011, S. 1-9, 2011.
LibreCat
2011 | Misc | LibreCat-ID: 42856
K. Kraft, Cutting Patterns. in: Lois Weinthal (ed.): Toward a New Interior. An Anthology of Interior Design Theory, New York 2011, 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 25965
A. Chernikov, S. Horst, T. Waitz, M. Tiemann, and S. Chatterjee, “Photoluminescence Properties of Ordered Mesoporous ZnO,” The Journal of Physical Chemistry C, pp. 1375–1379, 2011, doi: 10.1021/jp104293e.
LibreCat
| DOI
2011 | Report | LibreCat-ID: 42970
S. Sevignani, V. Kreilinger, T. Allmer, and C. Fuchs, Analysis of Existing Empirical Research Methods for Studying (Online) Privacy and Surveillance. 2011.
LibreCat
2011 | Report | LibreCat-ID: 42969
T. Allmer, Towards a Critical Theory of Surveillance Studies. Vienna, 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 43008
T. Allmer, “Critical Surveillance Studies in the Information Society,” tripleC , vol. 9, no. 2, pp. 566–592, 2011, doi: https://doi.org/10.31269/triplec.v9i2.266.
LibreCat
| DOI
2011 | Book (Editor) | LibreCat-ID: 42946
M. Sandoval , S. Sevignani, A. Rehbogen, T. Allmer, M. Hager, and V. Kreilinger, Eds., Bildung MACHT Gesellschaft. Münster: Westfälisches Dampfboot., 2011.
LibreCat
2011 | Journal Article | LibreCat-ID: 39533
F. F. Vidor, G. I. Wirth, K. Wolff, and U. Hilleringmann, “Study on the Performance Enhancement of ZnO Nanoparticles Thin-Film Transistors,” ECS Transactions, vol. 39, no. 1, pp. 109–115, 2011, doi: 10.1149/1.3615183.
LibreCat
| DOI
2011 | Journal Article | LibreCat-ID: 39527
K. Wolff and U. Hilleringmann, “Solution processed inverter based on zinc oxide nanoparticle thin-film transistors with poly(4-vinylphenol) gate dielectric,” Solid-State Electronics, vol. 62, no. 1, pp. 110–114, 2011, doi: 10.1016/j.sse.2011.01.046.
LibreCat
| DOI
2011 | Conference Paper | LibreCat-ID: 39536
T. Frers, T. Hett, U. Hilleringmann, G. Berth, A. Widhalm, and A. Zrenner, “Characterization of SiON integrated waveguides via FTIR and AFM measurements,” 2011, doi: 10.1109/scd.2011.6068744.
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| DOI