Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs
J. Anwer, M. Platzner, in: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, 2014, pp. 177–184.
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Anwer, Jahanzeb;
Platzner, MarcoLibreCat
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IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
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177-184
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Anwer J, Platzner M. Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs. In: IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE; 2014:177-184. doi:10.1109/DFT.2014.6962108
Anwer, J., & Platzner, M. (2014). Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs. In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) (pp. 177–184). IEEE. https://doi.org/10.1109/DFT.2014.6962108
@inproceedings{Anwer_Platzner_2014, title={Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs}, DOI={10.1109/DFT.2014.6962108}, booktitle={IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)}, publisher={IEEE}, author={Anwer, Jahanzeb and Platzner, Marco}, year={2014}, pages={177–184} }
Anwer, Jahanzeb, and Marco Platzner. “Analytic Reliability Evaluation for Fault-Tolerant Circuit Structures on FPGAs.” In IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 177–84. IEEE, 2014. https://doi.org/10.1109/DFT.2014.6962108.
J. Anwer and M. Platzner, “Analytic reliability evaluation for fault-tolerant circuit structures on FPGAs,” in IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014, pp. 177–184.
Anwer, Jahanzeb, and Marco Platzner. “Analytic Reliability Evaluation for Fault-Tolerant Circuit Structures on FPGAs.” IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), IEEE, 2014, pp. 177–84, doi:10.1109/DFT.2014.6962108.
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