Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance

S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, B. Straube, Informacije MIDEM, Ljubljana (Invited Paper) 37 (2007) 212–219.

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Journal Article | English
Author
Hellebrand, SybilleLibreCat ; G. Zoellin, Christian; Wunderlich, Hans-Joachim; Ludwig, Stefan; Coym, Torsten; Straube, Bernd
Publishing Year
Journal Title
Informacije MIDEM, Ljubljana (Invited Paper)
Volume
37
Issue
4 (124)
Page
212-219
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Hellebrand S, G. Zoellin C, Wunderlich H-J, Ludwig S, Coym T, Straube B. Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. Informacije MIDEM, Ljubljana (Invited Paper). 2007;37(4 (124)):212-219.
Hellebrand, S., G. Zoellin, C., Wunderlich, H.-J., Ludwig, S., Coym, T., & Straube, B. (2007). Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance. Informacije MIDEM, Ljubljana (Invited Paper), 37(4 (124)), 212–219.
@article{Hellebrand_G. Zoellin_Wunderlich_Ludwig_Coym_Straube_2007, title={Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance}, volume={37}, number={4 (124)}, journal={Informacije MIDEM, Ljubljana (Invited Paper)}, author={Hellebrand, Sybille and G. Zoellin, Christian and Wunderlich, Hans-Joachim and Ludwig, Stefan and Coym, Torsten and Straube, Bernd}, year={2007}, pages={212–219} }
Hellebrand, Sybille, Christian G. Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, and Bernd Straube. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper) 37, no. 4 (124) (2007): 212–19.
S. Hellebrand, C. G. Zoellin, H.-J. Wunderlich, S. Ludwig, T. Coym, and B. Straube, “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance,” Informacije MIDEM, Ljubljana (Invited Paper), vol. 37, no. 4 (124), pp. 212–219, 2007.
Hellebrand, Sybille, et al. “Testing and Monitoring Nanoscale Systems - Challenges and Strategies for Advanced Quality Assurance.” Informacije MIDEM, Ljubljana (Invited Paper), vol. 37, no. 4 (124), 2007, pp. 212–19.

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