Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?
C. Richter, J.F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, H. Wehrheim, in: 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023.
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Richter, CedricLibreCat;
Haltermann, Jan FrederikLibreCat;
Jakobs, Marie-Christine;
Pauck, FelixLibreCat;
Schott, StefanLibreCat;
Wehrheim, HeikeLibreCat
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37th IEEE/ACM International Conference on Automated Software Engineering
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Richter C, Haltermann JF, Jakobs M-C, Pauck F, Schott S, Wehrheim H. Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs? In: 37th IEEE/ACM International Conference on Automated Software Engineering. ACM; 2023. doi:10.1145/3551349.3561156
Richter, C., Haltermann, J. F., Jakobs, M.-C., Pauck, F., Schott, S., & Wehrheim, H. (2023). Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs? 37th IEEE/ACM International Conference on Automated Software Engineering. https://doi.org/10.1145/3551349.3561156
@inproceedings{Richter_Haltermann_Jakobs_Pauck_Schott_Wehrheim_2023, title={Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?}, DOI={10.1145/3551349.3561156}, booktitle={37th IEEE/ACM International Conference on Automated Software Engineering}, publisher={ACM}, author={Richter, Cedric and Haltermann, Jan Frederik and Jakobs, Marie-Christine and Pauck, Felix and Schott, Stefan and Wehrheim, Heike}, year={2023} }
Richter, Cedric, Jan Frederik Haltermann, Marie-Christine Jakobs, Felix Pauck, Stefan Schott, and Heike Wehrheim. “Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?” In 37th IEEE/ACM International Conference on Automated Software Engineering. ACM, 2023. https://doi.org/10.1145/3551349.3561156.
C. Richter, J. F. Haltermann, M.-C. Jakobs, F. Pauck, S. Schott, and H. Wehrheim, “Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?,” 2023, doi: 10.1145/3551349.3561156.
Richter, Cedric, et al. “Are Neural Bug Detectors Comparable to Software Developers on Variable Misuse Bugs?” 37th IEEE/ACM International Conference on Automated Software Engineering, ACM, 2023, doi:10.1145/3551349.3561156.
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