Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction

T. Sander, S. Lange, U. Hilleringmann, V. Geneis, C. Hedayat, H. Kuhn, F.-B. Gockel, in: 2021 22nd IEEE International Conference on Industrial Technology (ICIT), IEEE, 2021.

Download
No fulltext has been uploaded.
Conference Paper | Published | English
Author
Sander, Tom; Lange, Sven; Hilleringmann, UlrichLibreCat; Geneis, Volker; Hedayat, Christian; Kuhn, Harald; Gockel, Franz-Barthold
Department
Publishing Year
Proceedings Title
2021 22nd IEEE International Conference on Industrial Technology (ICIT)
LibreCat-ID

Cite this

Sander T, Lange S, Hilleringmann U, et al. Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. In: 2021 22nd IEEE International Conference on Industrial Technology (ICIT). IEEE; 2021. doi:10.1109/icit46573.2021.9453646
Sander, T., Lange, S., Hilleringmann, U., Geneis, V., Hedayat, C., Kuhn, H., & Gockel, F.-B. (2021). Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction. 2021 22nd IEEE International Conference on Industrial Technology (ICIT). https://doi.org/10.1109/icit46573.2021.9453646
@inproceedings{Sander_Lange_Hilleringmann_Geneis_Hedayat_Kuhn_Gockel_2021, title={Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction}, DOI={10.1109/icit46573.2021.9453646}, booktitle={2021 22nd IEEE International Conference on Industrial Technology (ICIT)}, publisher={IEEE}, author={Sander, Tom and Lange, Sven and Hilleringmann, Ulrich and Geneis, Volker and Hedayat, Christian and Kuhn, Harald and Gockel, Franz-Barthold}, year={2021} }
Sander, Tom, Sven Lange, Ulrich Hilleringmann, Volker Geneis, Christian Hedayat, Harald Kuhn, and Franz-Barthold Gockel. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.” In 2021 22nd IEEE International Conference on Industrial Technology (ICIT). IEEE, 2021. https://doi.org/10.1109/icit46573.2021.9453646.
T. Sander et al., “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction,” 2021, doi: 10.1109/icit46573.2021.9453646.
Sander, Tom, et al. “Detection of Defects on Irregular Structured Surfaces by Image Processing Methods for Feature Extraction.” 2021 22nd IEEE International Conference on Industrial Technology (ICIT), IEEE, 2021, doi:10.1109/icit46573.2021.9453646.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar