Matching analysis of NMOS-transistors with a channel length down to 30 nm

J.T. Horstmann, U. Hilleringmann, K. Goser, in: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003.

Download
No fulltext has been uploaded.
Conference Paper | Published | English
Author
Horstmann, J.T.; Hilleringmann, UlrichLibreCat; Goser, K.
Department
Publishing Year
Proceedings Title
IECON'99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)
LibreCat-ID

Cite this

Horstmann JT, Hilleringmann U, Goser K. Matching analysis of NMOS-transistors with a channel length down to 30 nm. In: IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE; 2003. doi:10.1109/iecon.1999.822163
Horstmann, J. T., Hilleringmann, U., & Goser, K. (2003). Matching analysis of NMOS-transistors with a channel length down to 30 nm. IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). https://doi.org/10.1109/iecon.1999.822163
@inproceedings{Horstmann_Hilleringmann_Goser_2003, title={Matching analysis of NMOS-transistors with a channel length down to 30 nm}, DOI={10.1109/iecon.1999.822163}, booktitle={IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029)}, publisher={IEEE}, author={Horstmann, J.T. and Hilleringmann, Ulrich and Goser, K.}, year={2003} }
Horstmann, J.T., Ulrich Hilleringmann, and K. Goser. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” In IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029). IEEE, 2003. https://doi.org/10.1109/iecon.1999.822163.
J. T. Horstmann, U. Hilleringmann, and K. Goser, “Matching analysis of NMOS-transistors with a channel length down to 30 nm,” 2003, doi: 10.1109/iecon.1999.822163.
Horstmann, J. T., et al. “Matching Analysis of NMOS-Transistors with a Channel Length down to 30 Nm.” IECON’99. Conference Proceedings. 25th Annual Conference of the IEEE Industrial Electronics Society (Cat. No.99CH37029), IEEE, 2003, doi:10.1109/iecon.1999.822163.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar