Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers

K. Huba, D. Krix, C. Meier, H. Nienhaus, Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27 (2009) 889–894.

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Journal Article | Published | English
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Journal Title
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films
Volume
27
Issue
4
Page
889-894
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Huba K, Krix D, Meier C, Nienhaus H. Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 2009;27(4):889-894. doi:10.1116/1.3100218
Huba, K., Krix, D., Meier, C., & Nienhaus, H. (2009). Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers. Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 27(4), 889–894. https://doi.org/10.1116/1.3100218
@article{Huba_Krix_Meier_Nienhaus_2009, title={Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers}, volume={27}, DOI={10.1116/1.3100218}, number={4}, journal={Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films}, publisher={American Vacuum Society}, author={Huba, K. and Krix, D. and Meier, Cedrik and Nienhaus, H.}, year={2009}, pages={889–894} }
Huba, K., D. Krix, Cedrik Meier, and H. Nienhaus. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 27, no. 4 (2009): 889–94. https://doi.org/10.1116/1.3100218.
K. Huba, D. Krix, C. Meier, and H. Nienhaus, “Ultrathin K∕p-Si(001) Schottky diodes as detectors of chemically generated hot charge carriers,” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, pp. 889–894, 2009.
Huba, K., et al. “Ultrathin K∕p-Si(001) Schottky Diodes as Detectors of Chemically Generated Hot Charge Carriers.” Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, vol. 27, no. 4, American Vacuum Society, 2009, pp. 889–94, doi:10.1116/1.3100218.

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