Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy

R.D. Tscheuschner, S. Hoch, E. Leschinsky, C. Meier, S. Theis, A.D. Wieck, International Journal of Modern Physics B 12 (1998) 1147–1170.

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Journal Article | Published | English
Author
Tscheuschner, Ralf D.; Hoch, Sascha; Leschinsky, Eva; Meier, CedrikLibreCat ; Theis, Sabine; Wieck, Andreas D.
Department
Publishing Year
Journal Title
International Journal of Modern Physics B
Volume
12
Issue
11
Page
1147-1170
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Tscheuschner RD, Hoch S, Leschinsky E, Meier C, Theis S, Wieck AD. Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy. International Journal of Modern Physics B. 1998;12(11):1147-1170. doi:10.1142/s0217979298000636
Tscheuschner, R. D., Hoch, S., Leschinsky, E., Meier, C., Theis, S., & Wieck, A. D. (1998). Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy. International Journal of Modern Physics B, 12(11), 1147–1170. https://doi.org/10.1142/s0217979298000636
@article{Tscheuschner_Hoch_Leschinsky_Meier_Theis_Wieck_1998, title={Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy}, volume={12}, DOI={10.1142/s0217979298000636}, number={11}, journal={International Journal of Modern Physics B}, publisher={World Scientific Pub Co Pte Lt}, author={Tscheuschner, Ralf D. and Hoch, Sascha and Leschinsky, Eva and Meier, Cedrik and Theis, Sabine and Wieck, Andreas D.}, year={1998}, pages={1147–1170} }
Tscheuschner, Ralf D., Sascha Hoch, Eva Leschinsky, Cedrik Meier, Sabine Theis, and Andreas D. Wieck. “Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy.” International Journal of Modern Physics B 12, no. 11 (1998): 1147–70. https://doi.org/10.1142/s0217979298000636.
R. D. Tscheuschner, S. Hoch, E. Leschinsky, C. Meier, S. Theis, and A. D. Wieck, “Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy,” International Journal of Modern Physics B, vol. 12, no. 11, pp. 1147–1170, 1998.
Tscheuschner, Ralf D., et al. “Robustness of the Quantum Hall Effect, Sample Size Versus Sample Topology, and Quality Control Management of III–V Molecular Beam Epitaxy.” International Journal of Modern Physics B, vol. 12, no. 11, World Scientific Pub Co Pte Lt, 1998, pp. 1147–70, doi:10.1142/s0217979298000636.

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