A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic

H. Ghasemzadeh Mohammadi, H. Tabkhi, S.G. Miremadi, A. Ejlali, in: 2008 International Conference on Microelectronics, IEEE, 2008, pp. 444–447.

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2008 International Conference on Microelectronics
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444-447
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Ghasemzadeh Mohammadi H, Tabkhi H, Miremadi SG, Ejlali A. A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic. In: 2008 International Conference on Microelectronics. IEEE; 2008:444-447. doi:10.1109/ICM.2008.5393497
Ghasemzadeh Mohammadi, H., Tabkhi, H., Miremadi, S. G., & Ejlali, A. (2008). A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic. In 2008 International Conference on Microelectronics (pp. 444–447). IEEE. https://doi.org/10.1109/ICM.2008.5393497
@inproceedings{Ghasemzadeh Mohammadi_Tabkhi_Miremadi_Ejlali_2008, title={A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic}, DOI={10.1109/ICM.2008.5393497}, booktitle={2008 International Conference on Microelectronics}, publisher={IEEE}, author={Ghasemzadeh Mohammadi, Hassan and Tabkhi, Hamed and Miremadi, Seyed Ghassem and Ejlali, Alireza}, year={2008}, pages={444–447} }
Ghasemzadeh Mohammadi, Hassan, Hamed Tabkhi, Seyed Ghassem Miremadi, and Alireza Ejlali. “A Cost-Effective Error Detection and Roll-Back Recovery Technique for Embedded Microprocessor Control Logic.” In 2008 International Conference on Microelectronics, 444–47. IEEE, 2008. https://doi.org/10.1109/ICM.2008.5393497.
H. Ghasemzadeh Mohammadi, H. Tabkhi, S. G. Miremadi, and A. Ejlali, “A cost-effective error detection and roll-back recovery technique for embedded microprocessor control logic,” in 2008 International Conference on Microelectronics, 2008, pp. 444–447.
Ghasemzadeh Mohammadi, Hassan, et al. “A Cost-Effective Error Detection and Roll-Back Recovery Technique for Embedded Microprocessor Control Logic.” 2008 International Conference on Microelectronics, IEEE, 2008, pp. 444–47, doi:10.1109/ICM.2008.5393497.

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