Towards a KPI-based Ontology for Condition Monitoring of Automation Systems

F. Pasic, B. Wohlers, M. Becker, in: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–1285.

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2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)
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1282-1285
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Pasic F, Wohlers B, Becker M. Towards a KPI-based Ontology for Condition Monitoring of Automation Systems. In: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). ; 2019:1282-1285.
Pasic, F., Wohlers, B., & Becker, M. (2019). Towards a KPI-based Ontology for Condition Monitoring of Automation Systems. In 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) (pp. 1282–1285).
@inproceedings{Pasic_Wohlers_Becker_2019, title={Towards a KPI-based Ontology for Condition Monitoring of Automation Systems}, booktitle={2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)}, author={Pasic, Faruk and Wohlers, Benedict and Becker, Matthias}, year={2019}, pages={1282–1285} }
Pasic, Faruk, Benedict Wohlers, and Matthias Becker. “Towards a KPI-Based Ontology for Condition Monitoring of Automation Systems.” In 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 1282–85, 2019.
F. Pasic, B. Wohlers, and M. Becker, “Towards a KPI-based Ontology for Condition Monitoring of Automation Systems,” in 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–1285.
Pasic, Faruk, et al. “Towards a KPI-Based Ontology for Condition Monitoring of Automation Systems.” 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–85.

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