Towards a KPI-based Ontology for Condition Monitoring of Automation Systems
F. Pasic, B. Wohlers, M. Becker, in: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–1285.
Download
No fulltext has been uploaded.
Conference Paper
Author
Pasic, Faruk;
Wohlers, Benedict;
Becker, Matthias
Publishing Year
Proceedings Title
2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)
Page
1282-1285
LibreCat-ID
Cite this
Pasic F, Wohlers B, Becker M. Towards a KPI-based Ontology for Condition Monitoring of Automation Systems. In: 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA). ; 2019:1282-1285.
Pasic, F., Wohlers, B., & Becker, M. (2019). Towards a KPI-based Ontology for Condition Monitoring of Automation Systems. In 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA) (pp. 1282–1285).
@inproceedings{Pasic_Wohlers_Becker_2019, title={Towards a KPI-based Ontology for Condition Monitoring of Automation Systems}, booktitle={2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA)}, author={Pasic, Faruk and Wohlers, Benedict and Becker, Matthias}, year={2019}, pages={1282–1285} }
Pasic, Faruk, Benedict Wohlers, and Matthias Becker. “Towards a KPI-Based Ontology for Condition Monitoring of Automation Systems.” In 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 1282–85, 2019.
F. Pasic, B. Wohlers, and M. Becker, “Towards a KPI-based Ontology for Condition Monitoring of Automation Systems,” in 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–1285.
Pasic, Faruk, et al. “Towards a KPI-Based Ontology for Condition Monitoring of Automation Systems.” 2019 24th IEEE International Conference on Emerging Technologies and Factory Automation (ETFA), 2019, pp. 1282–85.
Google Scholar