Nonlinear Imaging of Nanoscale Topological Corner States

S.S. Kruk, W. Gao, D.-Y. Choi, T. Zentgraf, S. Zhang, Y. Kivshar, Nano Letters 21 (2021) 4592–4597.

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Journal Article | Published | English
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Abstract
Topological states of light represent counterintuitive optical modes localized at boundaries of finite-size optical structures that originate from the properties of the bulk. Being defined by bulk properties, such boundary states are insensitive to certain types of perturbations, thus naturally enhancing robustness of photonic circuitries. Conventionally, the N-dimensional bulk modes correspond to (N – 1)-dimensional boundary states. The higher-order bulk-boundary correspondence relates N-dimensional bulk to boundary states with dimensionality reduced by more than 1. A special interest lies in miniaturization of such higher-order topological states to the nanoscale. Here, we realize nanoscale topological corner states in metasurfaces with C6-symmetric honeycomb lattices. We directly observe nanoscale topology-empowered edge and corner localizations of light and enhancement of light–matter interactions via a nonlinear imaging technique. Control of light at the nanoscale empowered by topology may facilitate miniaturization and on-chip integration of classical and quantum photonic devices.
Publishing Year
Journal Title
Nano Letters
Volume
21
Issue
11
Page
4592–4597
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Kruk SS, Gao W, Choi D-Y, Zentgraf T, Zhang S, Kivshar Y. Nonlinear Imaging of Nanoscale Topological Corner States. Nano Letters. 2021;21(11):4592–4597. doi:10.1021/acs.nanolett.1c00449
Kruk, S. S., Gao, W., Choi, D.-Y., Zentgraf, T., Zhang, S., & Kivshar, Y. (2021). Nonlinear Imaging of Nanoscale Topological Corner States. Nano Letters, 21(11), 4592–4597. https://doi.org/10.1021/acs.nanolett.1c00449
@article{Kruk_Gao_Choi_Zentgraf_Zhang_Kivshar_2021, title={Nonlinear Imaging of Nanoscale Topological Corner States}, volume={21}, DOI={10.1021/acs.nanolett.1c00449}, number={11}, journal={Nano Letters}, publisher={ACS}, author={Kruk, Sergey S. and Gao, Wenlong and Choi, Duk-Yong and Zentgraf, Thomas and Zhang, Shuang and Kivshar, Yuri}, year={2021}, pages={4592–4597} }
Kruk, Sergey S., Wenlong Gao, Duk-Yong Choi, Thomas Zentgraf, Shuang Zhang, and Yuri Kivshar. “Nonlinear Imaging of Nanoscale Topological Corner States.” Nano Letters 21, no. 11 (2021): 4592–4597. https://doi.org/10.1021/acs.nanolett.1c00449.
S. S. Kruk, W. Gao, D.-Y. Choi, T. Zentgraf, S. Zhang, and Y. Kivshar, “Nonlinear Imaging of Nanoscale Topological Corner States,” Nano Letters, vol. 21, no. 11, pp. 4592–4597, 2021.
Kruk, Sergey S., et al. “Nonlinear Imaging of Nanoscale Topological Corner States.” Nano Letters, vol. 21, no. 11, ACS, 2021, pp. 4592–4597, doi:10.1021/acs.nanolett.1c00449.

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