Toward quantifying capacity losses due to solid electrolyte interphase evolution in silicon thin film batteries
H.-G. Steinrück, C. Cao, G.M. Veith, M.F. Toney, The Journal of Chemical Physics 152 (2020) 084702.
Download
No fulltext has been uploaded.
Journal Article
| Published
| English
Author
Steinrück, Hans-GeorgLibreCat 
;
Cao, Chuntian;
Veith, Gabriel M.;
Toney, Michael F.
;
Cao, Chuntian;
Veith, Gabriel M.;
Toney, Michael F.Department
Publishing Year
Journal Title
The Journal of Chemical Physics
Volume
152
Page
084702
LibreCat-ID
Cite this
Steinrück H-G, Cao C, Veith GM, Toney MF. Toward quantifying capacity losses due to solid electrolyte interphase evolution in silicon thin film batteries. The Journal of Chemical Physics. 2020;152:084702. doi:10.1063/1.5142643
Steinrück, H.-G., Cao, C., Veith, G. M., & Toney, M. F. (2020). Toward quantifying capacity losses due to solid electrolyte interphase evolution in silicon thin film batteries. The Journal of Chemical Physics, 152, 084702. https://doi.org/10.1063/1.5142643
@article{Steinrück_Cao_Veith_Toney_2020, title={Toward quantifying capacity losses due to solid electrolyte interphase evolution in silicon thin film batteries}, volume={152}, DOI={10.1063/1.5142643}, journal={The Journal of Chemical Physics}, author={Steinrück, Hans-Georg and Cao, Chuntian and Veith, Gabriel M. and Toney, Michael F.}, year={2020}, pages={084702} }
Steinrück, Hans-Georg, Chuntian Cao, Gabriel M. Veith, and Michael F. Toney. “Toward Quantifying Capacity Losses Due to Solid Electrolyte Interphase Evolution in Silicon Thin Film Batteries.” The Journal of Chemical Physics 152 (2020): 084702. https://doi.org/10.1063/1.5142643.
H.-G. Steinrück, C. Cao, G. M. Veith, and M. F. Toney, “Toward quantifying capacity losses due to solid electrolyte interphase evolution in silicon thin film batteries,” The Journal of Chemical Physics, vol. 152, p. 084702, 2020, doi: 10.1063/1.5142643.
Steinrück, Hans-Georg, et al. “Toward Quantifying Capacity Losses Due to Solid Electrolyte Interphase Evolution in Silicon Thin Film Batteries.” The Journal of Chemical Physics, vol. 152, 2020, p. 084702, doi:10.1063/1.5142643.
Google Scholar