In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity

C. Cao, H.-G. Steinrück, B. Shyam, K.H. Stone, M.F. Toney, Nano Letters 16 (2016) 7394–7401.

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Journal Article | Published | English
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Nano Letters
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16
Page
7394-7401
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Cao C, Steinrück H-G, Shyam B, Stone KH, Toney MF. In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity. Nano Letters. 2016;16:7394-7401. doi:10.1021/acs.nanolett.6b02926
Cao, C., Steinrück, H.-G., Shyam, B., Stone, K. H., & Toney, M. F. (2016). In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity. Nano Letters, 16, 7394–7401. https://doi.org/10.1021/acs.nanolett.6b02926
@article{Cao_Steinrück_Shyam_Stone_Toney_2016, title={In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity}, volume={16}, DOI={10.1021/acs.nanolett.6b02926}, journal={Nano Letters}, author={Cao, Chuntian and Steinrück, Hans-Georg and Shyam, Badri and Stone, Kevin H. and Toney, Michael F.}, year={2016}, pages={7394–7401} }
Cao, Chuntian, Hans-Georg Steinrück, Badri Shyam, Kevin H. Stone, and Michael F. Toney. “In Situ Study of Silicon Electrode Lithiation with X-Ray Reflectivity.” Nano Letters 16 (2016): 7394–7401. https://doi.org/10.1021/acs.nanolett.6b02926.
C. Cao, H.-G. Steinrück, B. Shyam, K. H. Stone, and M. F. Toney, “In Situ Study of Silicon Electrode Lithiation with X-ray Reflectivity,” Nano Letters, vol. 16, pp. 7394–7401, 2016, doi: 10.1021/acs.nanolett.6b02926.
Cao, Chuntian, et al. “In Situ Study of Silicon Electrode Lithiation with X-Ray Reflectivity.” Nano Letters, vol. 16, 2016, pp. 7394–401, doi:10.1021/acs.nanolett.6b02926.

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