Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework
M. Woehrle, C. Plessl, J. Beutel, L. Thiele, in: Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, New York, NY, USA, 2007, pp. 93–97.
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Woehrle, Matthias;
Plessl, ChristianLibreCat 
;
Beutel, Jan;
Thiele, Lothar
;
Beutel, Jan;
Thiele, LotharKeywords
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Proceedings Title
Proc. Workshop on Embedded Networked Sensors (EmNets)
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93-97
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Woehrle M, Plessl C, Beutel J, Thiele L. Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. In: Proc. Workshop on Embedded Networked Sensors (EmNets). ACM; 2007:93-97. doi:10.1145/1278972.1278996
Woehrle, M., Plessl, C., Beutel, J., & Thiele, L. (2007). Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework. Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. https://doi.org/10.1145/1278972.1278996
@inproceedings{Woehrle_Plessl_Beutel_Thiele_2007, place={New York, NY, USA}, title={Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework}, DOI={10.1145/1278972.1278996}, booktitle={Proc. Workshop on Embedded Networked Sensors (EmNets)}, publisher={ACM}, author={Woehrle, Matthias and Plessl, Christian and Beutel, Jan and Thiele, Lothar}, year={2007}, pages={93–97} }
Woehrle, Matthias, Christian Plessl, Jan Beutel, and Lothar Thiele. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” In Proc. Workshop on Embedded Networked Sensors (EmNets), 93–97. New York, NY, USA: ACM, 2007. https://doi.org/10.1145/1278972.1278996.
M. Woehrle, C. Plessl, J. Beutel, and L. Thiele, “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework,” in Proc. Workshop on Embedded Networked Sensors (EmNets), 2007, pp. 93–97, doi: 10.1145/1278972.1278996.
Woehrle, Matthias, et al. “Increasing the Reliability of Wireless Sensor Networks with a Distributed Testing Framework.” Proc. Workshop on Embedded Networked Sensors (EmNets), ACM, 2007, pp. 93–97, doi:10.1145/1278972.1278996.
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