Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013
G. Schirner, M. Götz, A. Rettberg, M.C. Zanella, F.-J. Rammig, eds., Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013, Springer, 2013.
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| English
Editor
Schirner, Gunar;
Götz, Marcelo;
Rettberg, Achim;
Zanella, Mauro C.;
Rammig, Franz-Josef
Publishing Year
Series Title / Volume
Band IFIP AICT 403
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Schirner G, Götz M, Rettberg A, Zanella MC, Rammig F-J, eds. Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013. Springer; 2013.
Schirner, G., Götz, M., Rettberg, A., Zanella, M. C., & Rammig, F.-J. (Eds.). (2013). Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013. Springer.
@book{Schirner_Götz_Rettberg_Zanella_Rammig_2013, series={Band IFIP AICT 403 }, title={Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013}, publisher={Springer}, year={2013}, collection={Band IFIP AICT 403 } }
Schirner, Gunar, Marcelo Götz, Achim Rettberg, Mauro C. Zanella, and Franz-Josef Rammig, eds. Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013. Band IFIP AICT 403 . Springer, 2013.
G. Schirner, M. Götz, A. Rettberg, M. C. Zanella, and F.-J. Rammig, Eds., Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013. Springer, 2013.
Schirner, Gunar, et al., editors. Embedded Systems: Design, Analysis and Verification. Proceedings of the 4th IFIP TC10 International Embedded Systems Symposium, IESS 2013, Paderborn, Germany, June 2013. Springer, 2013.
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