Detecting White Spots in Innovation-Driven Intellectual Property Management
D. Eckelt, C. Dülme, J. Gausemeier, S. Hemel, Technology Innovation Management Review 6(7) (2016) 34–47.
Download
No fulltext has been uploaded.
Journal Article
| English
Author
Eckelt, Daniel;
Dülme, Christian;
Gausemeier, Jürgen;
Hemel, Simon
Publishing Year
Journal Title
Technology Innovation Management Review 6(7)
Page
34-47
LibreCat-ID
Cite this
Eckelt D, Dülme C, Gausemeier J, Hemel S. Detecting White Spots in Innovation-Driven Intellectual Property Management. Technology Innovation Management Review 6(7). Published online 2016:34-47.
Eckelt, D., Dülme, C., Gausemeier, J., & Hemel, S. (2016). Detecting White Spots in Innovation-Driven Intellectual Property Management. Technology Innovation Management Review 6(7), 34–47.
@article{Eckelt_Dülme_Gausemeier_Hemel_2016, title={Detecting White Spots in Innovation-Driven Intellectual Property Management}, journal={Technology Innovation Management Review 6(7)}, author={Eckelt, Daniel and Dülme, Christian and Gausemeier, Jürgen and Hemel, Simon}, year={2016}, pages={34–47} }
Eckelt, Daniel, Christian Dülme, Jürgen Gausemeier, and Simon Hemel. “Detecting White Spots in Innovation-Driven Intellectual Property Management.” Technology Innovation Management Review 6(7), 2016, 34–47.
D. Eckelt, C. Dülme, J. Gausemeier, and S. Hemel, “Detecting White Spots in Innovation-Driven Intellectual Property Management,” Technology Innovation Management Review 6(7), pp. 34–47, 2016.
Eckelt, Daniel, et al. “Detecting White Spots in Innovation-Driven Intellectual Property Management.” Technology Innovation Management Review 6(7), 2016, pp. 34–47.
Google Scholar