Detecting white spots in innovation-driven intellectual property management

D. Eckelt, C. Dülme, J. Gausemeier, S. Hemel, in: International Society for Professional Innovation Management (ISPIM), ISPIM Innovation Forum, 2016.

Download
No fulltext has been uploaded.
Conference Paper | English
Author
Eckelt, Daniel; Dülme, Christian; Gausemeier, Jürgen; Hemel, Simon
Publishing Year
Proceedings Title
International Society for Professional Innovation Management (ISPIM)
LibreCat-ID

Cite this

Eckelt D, Dülme C, Gausemeier J, Hemel S. Detecting white spots in innovation-driven intellectual property management. In: International Society for Professional Innovation Management (ISPIM). ISPIM Innovation Forum; 2016.
Eckelt, D., Dülme, C., Gausemeier, J., & Hemel, S. (2016). Detecting white spots in innovation-driven intellectual property management. International Society for Professional Innovation Management (ISPIM).
@inproceedings{Eckelt_Dülme_Gausemeier_Hemel_2016, title={Detecting white spots in innovation-driven intellectual property management}, booktitle={International Society for Professional Innovation Management (ISPIM)}, publisher={ISPIM Innovation Forum}, author={Eckelt, Daniel and Dülme, Christian and Gausemeier, Jürgen and Hemel, Simon}, year={2016} }
Eckelt, Daniel, Christian Dülme, Jürgen Gausemeier, and Simon Hemel. “Detecting White Spots in Innovation-Driven Intellectual Property Management.” In International Society for Professional Innovation Management (ISPIM). ISPIM Innovation Forum, 2016.
D. Eckelt, C. Dülme, J. Gausemeier, and S. Hemel, “Detecting white spots in innovation-driven intellectual property management,” 2016.
Eckelt, Daniel, et al. “Detecting White Spots in Innovation-Driven Intellectual Property Management.” International Society for Professional Innovation Management (ISPIM), ISPIM Innovation Forum, 2016.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar