Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance
J. Schmalhorst, D. Ebke, M. Sacher, N.-N. Liu, A. Thomas, G. Reiss, A. Htten, E. Arenholz, IEEE Transactions on Magnetics 43 (2007) 2806–2808.
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Journal Article
| Published
| English
Author
Schmalhorst, Jan;
Ebke, Daniel;
Sacher, MarcLibreCat 
;
Liu, Ning-Ning;
Thomas, Andy;
Reiss, Gnter;
Htten, Andreas;
Arenholz, Elke
;
Liu, Ning-Ning;
Thomas, Andy;
Reiss, Gnter;
Htten, Andreas;
Arenholz, ElkeDepartment
Publishing Year
Journal Title
IEEE Transactions on Magnetics
Volume
43
Issue
6
Page
2806-2808
ISSN
LibreCat-ID
Cite this
Schmalhorst J, Ebke D, Sacher M, et al. Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. IEEE Transactions on Magnetics. 2007;43(6):2806-2808. doi:10.1109/tmag.2007.893475
Schmalhorst, J., Ebke, D., Sacher, M., Liu, N.-N., Thomas, A., Reiss, G., Htten, A., & Arenholz, E. (2007). Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance. IEEE Transactions on Magnetics, 43(6), 2806–2808. https://doi.org/10.1109/tmag.2007.893475
@article{Schmalhorst_Ebke_Sacher_Liu_Thomas_Reiss_Htten_Arenholz_2007, title={Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance}, volume={43}, DOI={10.1109/tmag.2007.893475}, number={6}, journal={IEEE Transactions on Magnetics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Schmalhorst, Jan and Ebke, Daniel and Sacher, Marc and Liu, Ning-Ning and Thomas, Andy and Reiss, Gnter and Htten, Andreas and Arenholz, Elke}, year={2007}, pages={2806–2808} }
Schmalhorst, Jan, Daniel Ebke, Marc Sacher, Ning-Ning Liu, Andy Thomas, Gnter Reiss, Andreas Htten, and Elke Arenholz. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” IEEE Transactions on Magnetics 43, no. 6 (2007): 2806–8. https://doi.org/10.1109/tmag.2007.893475.
J. Schmalhorst et al., “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance,” IEEE Transactions on Magnetics, vol. 43, no. 6, pp. 2806–2808, 2007, doi: 10.1109/tmag.2007.893475.
Schmalhorst, Jan, et al. “Chemical and Magnetic Interface Properties of Tunnel Junctions With Co$_2$MnSi/Co$_2$FeSi Multilayer Electrode Showing Large Tunneling Magnetoresistance.” IEEE Transactions on Magnetics, vol. 43, no. 6, Institute of Electrical and Electronics Engineers (IEEE), 2007, pp. 2806–08, doi:10.1109/tmag.2007.893475.
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