Magnetic and chemical properties of Co[sub 2]MnSi thin films compared to the Co[sub 2]MnSi∕Al-O interface
J. Schmalhorst, M. Sacher, V. Höink, G. Reiss, A. Hütten, D. Engel, A. Ehresmann, Journal of Applied Physics 100 (2006).
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Journal Article
| Published
| English
Author
Schmalhorst, J.;
Sacher, MarcLibreCat 
;
Höink, V.;
Reiss, G.;
Hütten, A.;
Engel, D.;
Ehresmann, A.
;
Höink, V.;
Reiss, G.;
Hütten, A.;
Engel, D.;
Ehresmann, A.Department
Keywords
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Journal Title
Journal of Applied Physics
Volume
100
Issue
11
Article Number
113903
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LibreCat-ID
Cite this
Schmalhorst J, Sacher M, Höink V, et al. Magnetic and chemical properties of Co[sub 2]MnSi thin films compared to the Co[sub 2]MnSi∕Al-O interface. Journal of Applied Physics. 2006;100(11). doi:10.1063/1.2384806
Schmalhorst, J., Sacher, M., Höink, V., Reiss, G., Hütten, A., Engel, D., & Ehresmann, A. (2006). Magnetic and chemical properties of Co[sub 2]MnSi thin films compared to the Co[sub 2]MnSi∕Al-O interface. Journal of Applied Physics, 100(11), Article 113903. https://doi.org/10.1063/1.2384806
@article{Schmalhorst_Sacher_Höink_Reiss_Hütten_Engel_Ehresmann_2006, title={Magnetic and chemical properties of Co[sub 2]MnSi thin films compared to the Co[sub 2]MnSi∕Al-O interface}, volume={100}, DOI={10.1063/1.2384806}, number={11113903}, journal={Journal of Applied Physics}, publisher={AIP Publishing}, author={Schmalhorst, J. and Sacher, Marc and Höink, V. and Reiss, G. and Hütten, A. and Engel, D. and Ehresmann, A.}, year={2006} }
Schmalhorst, J., Marc Sacher, V. Höink, G. Reiss, A. Hütten, D. Engel, and A. Ehresmann. “Magnetic and Chemical Properties of Co[Sub 2]MnSi Thin Films Compared to the Co[Sub 2]MnSi∕Al-O Interface.” Journal of Applied Physics 100, no. 11 (2006). https://doi.org/10.1063/1.2384806.
J. Schmalhorst et al., “Magnetic and chemical properties of Co[sub 2]MnSi thin films compared to the Co[sub 2]MnSi∕Al-O interface,” Journal of Applied Physics, vol. 100, no. 11, Art. no. 113903, 2006, doi: 10.1063/1.2384806.
Schmalhorst, J., et al. “Magnetic and Chemical Properties of Co[Sub 2]MnSi Thin Films Compared to the Co[Sub 2]MnSi∕Al-O Interface.” Journal of Applied Physics, vol. 100, no. 11, 113903, AIP Publishing, 2006, doi:10.1063/1.2384806.
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