High dynamic control of a three-level voltage-source-converter drive for a main strip mill
J. Böcker, J. Janning, H. Jebenstreit, IEEE Transactions on Industrial Electronics 49 (2002) 1081–1092.
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Journal Article
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| English
Author
Böcker, JoachimLibreCat 
;
Janning, Jörg;
Jebenstreit, Helmut
;
Janning, Jörg;
Jebenstreit, HelmutPublishing Year
Journal Title
IEEE Transactions on Industrial Electronics
Volume
49
Issue
5
Page
1081-1092
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LibreCat-ID
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Böcker J, Janning J, Jebenstreit H. High dynamic control of a three-level voltage-source-converter drive for a main strip mill. IEEE Transactions on Industrial Electronics. 2002;49(5):1081-1092. doi:10.1109/tie.2002.803220
Böcker, J., Janning, J., & Jebenstreit, H. (2002). High dynamic control of a three-level voltage-source-converter drive for a main strip mill. IEEE Transactions on Industrial Electronics, 49(5), 1081–1092. https://doi.org/10.1109/tie.2002.803220
@article{Böcker_Janning_Jebenstreit_2002, title={High dynamic control of a three-level voltage-source-converter drive for a main strip mill}, volume={49}, DOI={10.1109/tie.2002.803220}, number={5}, journal={IEEE Transactions on Industrial Electronics}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Böcker, Joachim and Janning, Jörg and Jebenstreit, Helmut}, year={2002}, pages={1081–1092} }
Böcker, Joachim, Jörg Janning, and Helmut Jebenstreit. “High Dynamic Control of a Three-Level Voltage-Source-Converter Drive for a Main Strip Mill.” IEEE Transactions on Industrial Electronics 49, no. 5 (2002): 1081–92. https://doi.org/10.1109/tie.2002.803220.
J. Böcker, J. Janning, and H. Jebenstreit, “High dynamic control of a three-level voltage-source-converter drive for a main strip mill,” IEEE Transactions on Industrial Electronics, vol. 49, no. 5, pp. 1081–1092, 2002, doi: 10.1109/tie.2002.803220.
Böcker, Joachim, et al. “High Dynamic Control of a Three-Level Voltage-Source-Converter Drive for a Main Strip Mill.” IEEE Transactions on Industrial Electronics, vol. 49, no. 5, Institute of Electrical and Electronics Engineers (IEEE), 2002, pp. 1081–92, doi:10.1109/tie.2002.803220.
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