Generalization of orthogonality principle to model solenoidal wound multiwinding transformers

P. Wallmeier, in: Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248), IEEE, 2001.

Download
No fulltext has been uploaded.
Conference Paper | Published | English
Author
Wallmeier, P.
Publishing Year
Proceedings Title
Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248)
LibreCat-ID

Cite this

Wallmeier P. Generalization of orthogonality principle to model solenoidal wound multiwinding transformers. In: Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248). IEEE; 2001. doi:10.1109/ias.2001.955930
Wallmeier, P. (2001). Generalization of orthogonality principle to model solenoidal wound multiwinding transformers. Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248). https://doi.org/10.1109/ias.2001.955930
@inproceedings{Wallmeier_2001, title={Generalization of orthogonality principle to model solenoidal wound multiwinding transformers}, DOI={10.1109/ias.2001.955930}, booktitle={Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248)}, publisher={IEEE}, author={Wallmeier, P.}, year={2001} }
Wallmeier, P. “Generalization of Orthogonality Principle to Model Solenoidal Wound Multiwinding Transformers.” In Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248). IEEE, 2001. https://doi.org/10.1109/ias.2001.955930.
P. Wallmeier, “Generalization of orthogonality principle to model solenoidal wound multiwinding transformers,” 2001, doi: 10.1109/ias.2001.955930.
Wallmeier, P. “Generalization of Orthogonality Principle to Model Solenoidal Wound Multiwinding Transformers.” Conference Record of the 2001 IEEE Industry Applications Conference. 36th IAS Annual Meeting (Cat. No.01CH37248), IEEE, 2001, doi:10.1109/ias.2001.955930.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar