Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors
F.F. Vidor, T. Meyers, G.I. Wirth, U. Hilleringmann, in: Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–6.
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Vidor, Fabio F.;
Meyers, Thorsten;
Wirth, Gilson I.;
Hilleringmann, UlrichLibreCat
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Micro-Nano-Integration; 6. GMM-Workshop
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1-6
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Vidor FF, Meyers T, Wirth GI, Hilleringmann U. Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors. In: Micro-Nano-Integration; 6. GMM-Workshop. ; 2016:1-6.
Vidor, F. F., Meyers, T., Wirth, G. I., & Hilleringmann, U. (2016). Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors. Micro-Nano-Integration; 6. GMM-Workshop, 1–6.
@inproceedings{Vidor_Meyers_Wirth_Hilleringmann_2016, title={Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors}, booktitle={Micro-Nano-Integration; 6. GMM-Workshop}, author={Vidor, Fabio F. and Meyers, Thorsten and Wirth, Gilson I. and Hilleringmann, Ulrich}, year={2016}, pages={1–6} }
Vidor, Fabio F., Thorsten Meyers, Gilson I. Wirth, and Ulrich Hilleringmann. “Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors.” In Micro-Nano-Integration; 6. GMM-Workshop, 1–6, 2016.
F. F. Vidor, T. Meyers, G. I. Wirth, and U. Hilleringmann, “Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors,” in Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–6.
Vidor, Fabio F., et al. “Influence of Traps on the Characteristics of ZnO Nanoparticles Thin-Film Transistors.” Micro-Nano-Integration; 6. GMM-Workshop, 2016, pp. 1–6.
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