Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors
K. Wolff, U. Hilleringmann, in: 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010.
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Wolff, Karsten;
Hilleringmann, UlrichLibreCat
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2010 Proceedings of the European Solid State Device Research Conference
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Wolff K, Hilleringmann U. Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors. In: 2010 Proceedings of the European Solid State Device Research Conference. IEEE; 2010. doi:10.1109/essderc.2010.5618383
Wolff, K., & Hilleringmann, U. (2010). Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors. 2010 Proceedings of the European Solid State Device Research Conference. https://doi.org/10.1109/essderc.2010.5618383
@inproceedings{Wolff_Hilleringmann_2010, title={Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors}, DOI={10.1109/essderc.2010.5618383}, booktitle={2010 Proceedings of the European Solid State Device Research Conference}, publisher={IEEE}, author={Wolff, Karsten and Hilleringmann, Ulrich}, year={2010} }
Wolff, Karsten, and Ulrich Hilleringmann. “Analysis and Modeling of Pseudo-Short-Channel Effects in ZnO-Nanoparticle Thin-Film Transistors.” In 2010 Proceedings of the European Solid State Device Research Conference. IEEE, 2010. https://doi.org/10.1109/essderc.2010.5618383.
K. Wolff and U. Hilleringmann, “Analysis and modeling of pseudo-short-channel effects in ZnO-nanoparticle thin-film transistors,” 2010, doi: 10.1109/essderc.2010.5618383.
Wolff, Karsten, and Ulrich Hilleringmann. “Analysis and Modeling of Pseudo-Short-Channel Effects in ZnO-Nanoparticle Thin-Film Transistors.” 2010 Proceedings of the European Solid State Device Research Conference, IEEE, 2010, doi:10.1109/essderc.2010.5618383.
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