Numerical analysis of defects in colloidal nanosphere masks
D. Drude, K. Brassat, C. Brodehl, T. Riedl, J. Lindner, in: 2014.
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Conference Paper
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Publishing Year
Conference
European Materials Research Society Fall Meeting 2014
Conference Location
Warsaw (Poland)
Conference Date
2014-09-15 – 2014-09-19
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Drude D, Brassat K, Brodehl C, Riedl T, Lindner J. Numerical analysis of defects in colloidal nanosphere masks. In: ; 2014.
Drude, D., Brassat, K., Brodehl, C., Riedl, T., & Lindner, J. (2014). Numerical analysis of defects in colloidal nanosphere masks. Presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland).
@inproceedings{Drude_Brassat_Brodehl_Riedl_Lindner_2014, title={Numerical analysis of defects in colloidal nanosphere masks}, author={Drude, Dennis and Brassat, Katharina and Brodehl, Christoph and Riedl, Thomas and Lindner, Jörg}, year={2014} }
Drude, Dennis, Katharina Brassat, Christoph Brodehl, Thomas Riedl, and Jörg Lindner. “Numerical Analysis of Defects in Colloidal Nanosphere Masks,” 2014.
D. Drude, K. Brassat, C. Brodehl, T. Riedl, and J. Lindner, “Numerical analysis of defects in colloidal nanosphere masks,” presented at the European Materials Research Society Fall Meeting 2014, Warsaw (Poland), 2014.
Drude, Dennis, et al. Numerical Analysis of Defects in Colloidal Nanosphere Masks. 2014.
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