Characterization of cubic GaN/AlN multi-quantum wells using state-of-the-art analytical STEM
J. Lindner, R.M. Kemper, D. As, D. Meeertens, A. Kovács, M. Luysberg, K. Tillmann, in: 2013, pp. 188–189.
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Conference Paper
Author
Lindner, JörgLibreCat;
Kemper, R.M.;
As, Donald;
Meeertens, D.;
Kovács, A.;
Luysberg, M.;
Tillmann, K.
Publishing Year
Page
188-189
Conference
Proceedings of the Microscopy Conference MC2013
Conference Location
Regensburg
Conference Date
2013-08-25 – 2013-08-30
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Cite this
Lindner J, Kemper RM, As D, et al. Characterization of cubic GaN/AlN multi-quantum wells using state-of-the-art analytical STEM. In: ; 2013:188-189.
Lindner, J., Kemper, R. M., As, D., Meeertens, D., Kovács, A., Luysberg, M., & Tillmann, K. (2013). Characterization of cubic GaN/AlN multi-quantum wells using state-of-the-art analytical STEM (pp. 188–189). Presented at the Proceedings of the Microscopy Conference MC2013, Regensburg.
@inproceedings{Lindner_Kemper_As_Meeertens_Kovács_Luysberg_Tillmann_2013, title={Characterization of cubic GaN/AlN multi-quantum wells using state-of-the-art analytical STEM}, author={Lindner, Jörg and Kemper, R.M. and As, Donald and Meeertens, D. and Kovács, A. and Luysberg, M. and Tillmann, K.}, year={2013}, pages={188–189} }
Lindner, Jörg, R.M. Kemper, Donald As, D. Meeertens, A. Kovács, M. Luysberg, and K. Tillmann. “Characterization of Cubic GaN/AlN Multi-Quantum Wells Using State-of-the-Art Analytical STEM,” 188–89, 2013.
J. Lindner et al., “Characterization of cubic GaN/AlN multi-quantum wells using state-of-the-art analytical STEM,” presented at the Proceedings of the Microscopy Conference MC2013, Regensburg, 2013, pp. 188–189.
Lindner, Jörg, et al. Characterization of Cubic GaN/AlN Multi-Quantum Wells Using State-of-the-Art Analytical STEM. 2013, pp. 188–89.
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