TEM investigation of GaN thin films grown on nanostructured 3C-SiC/Si(001) substrates

R.M. Kemper, L. Hiller, T. Stauden, J. Pezoldt, D. Meertens, M. Luysberg, K. Tillmann, T. Riedl, D. As, J. Lindner, in: 2012.

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Conference Paper | English
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Conference
European Microscopy Congress (EMC) 2012
Conference Location
Manchester (UK)
Conference Date
2012-09-16 – 2012-09-21
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Kemper RM, Hiller L, Stauden T, et al. TEM investigation of GaN thin films grown on nanostructured 3C-SiC/Si(001) substrates. In: ; 2012.
Kemper, R. M., Hiller, L., Stauden, T., Pezoldt, J., Meertens, D., Luysberg, M., … Lindner, J. (2012). TEM investigation of GaN thin films grown on nanostructured 3C-SiC/Si(001) substrates. Presented at the European Microscopy Congress (EMC) 2012, Manchester (UK).
@inproceedings{Kemper_Hiller_Stauden_Pezoldt_Meertens_Luysberg_Tillmann_Riedl_As_Lindner_2012, title={TEM investigation of GaN thin films grown on nanostructured 3C-SiC/Si(001) substrates}, author={Kemper, R.M. and Hiller, L. and Stauden, T. and Pezoldt, J. and Meertens, D. and Luysberg, M. and Tillmann, K. and Riedl, Thomas and As, Donald and Lindner, Jörg}, year={2012} }
Kemper, R.M., L. Hiller, T. Stauden, J. Pezoldt, D. Meertens, M. Luysberg, K. Tillmann, Thomas Riedl, Donald As, and Jörg Lindner. “TEM Investigation of GaN Thin Films Grown on Nanostructured 3C-SiC/Si(001) Substrates,” 2012.
R. M. Kemper et al., “TEM investigation of GaN thin films grown on nanostructured 3C-SiC/Si(001) substrates,” presented at the European Microscopy Congress (EMC) 2012, Manchester (UK), 2012.
Kemper, R. M., et al. TEM Investigation of GaN Thin Films Grown on Nanostructured 3C-SiC/Si(001) Substrates. 2012.

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