Thermo-optic characterization of silicon nitride resonators for cryogenic photonic circuits
A.W. Elshaari, I.E. Zadeh, K.D. Jӧns, V. Zwiller, 8 (2016) 2701009.
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Conference Paper
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Author
Elshaari, A.W;
Zadeh, I. Esmaeil ;
Jӧns, Klaus D.;
Zwiller, V
Publishing Year
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IEEE Photonics
Volume
8
Page
2701009
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Elshaari AW, Zadeh IE, Jӧns KD, Zwiller V. Thermo-optic characterization of silicon nitride resonators for cryogenic photonic circuits. 2016;8:2701009.
Elshaari, A. W., Zadeh, I. E., Jӧns, K. D., & Zwiller, V. (2016). Thermo-optic characterization of silicon nitride resonators for cryogenic photonic circuits (Vol. 8, p. 2701009).
@article{Elshaari_Zadeh_Jӧns_Zwiller_2016, series={IEEE Photonics }, title={Thermo-optic characterization of silicon nitride resonators for cryogenic photonic circuits}, volume={8}, author={Elshaari, A.W and Zadeh, I. Esmaeil and Jӧns, Klaus D. and Zwiller, V}, year={2016}, pages={2701009}, collection={IEEE Photonics } }
Elshaari, A.W, I. Esmaeil Zadeh, Klaus D. Jӧns, and V Zwiller. “Thermo-Optic Characterization of Silicon Nitride Resonators for Cryogenic Photonic Circuits.” IEEE Photonics , 2016.
A. W. Elshaari, I. E. Zadeh, K. D. Jӧns, and V. Zwiller, “Thermo-optic characterization of silicon nitride resonators for cryogenic photonic circuits,” vol. 8. p. 2701009, 2016.
Elshaari, A. W., et al. Thermo-Optic Characterization of Silicon Nitride Resonators for Cryogenic Photonic Circuits. 2016, p. 2701009.
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