Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy
I. Kuznetsova, T. Meier, S.T. Cundiff, P. Thomas, Physical Review B 76 (2007).
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Journal Article
| Published
| English
Author
Kuznetsova, I.;
Meier, TorstenLibreCat 
;
Cundiff, S.T.;
Thomas, P.
;
Cundiff, S.T.;
Thomas, P. Department
Abstract
The imaginary part of two-dimensional Fourier-transform spectra in the rephasing and nonrephasing modes is used to analyze the homogeneous and inhomogeneous broadening of excitonic resonances in semiconductor nanostructures. Microscopic calculations that include heavy- and light-hole excitons as well as coherent biexcitonic many-body correlations reveal distinct differences between the rephasing and nonrephasing spectra. A procedure is proposed that allows separation of disorder-induced broadening in complex systems that show several coupled resonances.
Publishing Year
Journal Title
Physical Review B
Volume
76
Issue
15
Article Number
153301
LibreCat-ID
Cite this
Kuznetsova I, Meier T, Cundiff ST, Thomas P. Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy. Physical Review B. 2007;76(15). doi:10.1103/PhysRevB.76.153301
Kuznetsova, I., Meier, T., Cundiff, S. T., & Thomas, P. (2007). Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy. Physical Review B, 76(15), Article 153301. https://doi.org/10.1103/PhysRevB.76.153301
@article{Kuznetsova_Meier_Cundiff_Thomas_2007, title={Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy}, volume={76}, DOI={10.1103/PhysRevB.76.153301}, number={15153301}, journal={Physical Review B}, publisher={American Physical Society}, author={Kuznetsova, I. and Meier, Torsten and Cundiff, S.T. and Thomas, P. }, year={2007} }
Kuznetsova, I., Torsten Meier, S.T. Cundiff, and P. Thomas. “Determination of Homogeneous and Inhomogeneous Broadening in Semiconductor Nanostructures by Two-Dimensional Fourier-Transform Optical Spectroscopy.” Physical Review B 76, no. 15 (2007). https://doi.org/10.1103/PhysRevB.76.153301.
I. Kuznetsova, T. Meier, S. T. Cundiff, and P. Thomas, “Determination of homogeneous and inhomogeneous broadening in semiconductor nanostructures by two-dimensional Fourier-transform optical spectroscopy,” Physical Review B, vol. 76, no. 15, Art. no. 153301, 2007, doi: 10.1103/PhysRevB.76.153301.
Kuznetsova, I., et al. “Determination of Homogeneous and Inhomogeneous Broadening in Semiconductor Nanostructures by Two-Dimensional Fourier-Transform Optical Spectroscopy.” Physical Review B, vol. 76, no. 15, 153301, American Physical Society, 2007, doi:10.1103/PhysRevB.76.153301.
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