Microscopic Theory of Optical Dephasing in Semiconductors

T. Meier, S.W. Koch, F. Jahnke, P. Thomas, Applied Physics A 71 (2000) 511–517.

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Journal Article | Published | English
Author
Meier, TorstenLibreCat ; Koch, S.W.; Jahnke, F.; Thomas, P.
Abstract
Dephasing, i.e. the decay of the optical interband polarization in a semiconductor results from destructive interference effects between different microscopic contributions. For a system without any disorder it is shown that the many-body Coulomb correlations lead to excitation-induced dephasing which becomes increasingly important at elevated excitation levels. The effect of disorder-induced dephasing is analyzed for low excitation levels, where the combined influence of excitonic, biexcitonic, and disorder scattering contributions lead to a temporal decay of the four-wave-mixing signal.
Publishing Year
Journal Title
Applied Physics A
Volume
71
Page
511-517
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Meier T, Koch SW, Jahnke F, Thomas P. Microscopic Theory of Optical Dephasing in Semiconductors. Applied Physics A. 2000;71:511-517. doi:10.1007/s003390000707
Meier, T., Koch, S. W., Jahnke, F., & Thomas, P. (2000). Microscopic Theory of Optical Dephasing in Semiconductors. Applied Physics A, 71, 511–517. https://doi.org/10.1007/s003390000707
@article{Meier_Koch_Jahnke_Thomas_2000, title={Microscopic Theory of Optical Dephasing in Semiconductors}, volume={71}, DOI={10.1007/s003390000707}, journal={Applied Physics A}, publisher={Springer-Verlag}, author={Meier, Torsten and Koch, S.W. and Jahnke, F. and Thomas, P.}, year={2000}, pages={511–517} }
Meier, Torsten, S.W. Koch, F. Jahnke, and P. Thomas. “Microscopic Theory of Optical Dephasing in Semiconductors.” Applied Physics A 71 (2000): 511–17. https://doi.org/10.1007/s003390000707.
T. Meier, S. W. Koch, F. Jahnke, and P. Thomas, “Microscopic Theory of Optical Dephasing in Semiconductors,” Applied Physics A, vol. 71, pp. 511–517, 2000, doi: 10.1007/s003390000707.
Meier, Torsten, et al. “Microscopic Theory of Optical Dephasing in Semiconductors.” Applied Physics A, vol. 71, Springer-Verlag, 2000, pp. 511–17, doi:10.1007/s003390000707.

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