Coherent electric-field effects in semiconductors
T. Meier, G. von Plessen, P. Thomas, S.W. Koch, Physical Review Letters 73 (1994) 902–905.
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Journal Article
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| English
Author
Meier, TorstenLibreCat 
;
von Plessen, G.;
Thomas, P.;
Koch, S.W.
;
von Plessen, G.;
Thomas, P.;
Koch, S.W.Department
Abstract
We present a microscopic analysis of coherent effects induced by electric fields in photoexcited semiconductors in the presence of the Coulomb interaction. Both the terahertz emission and four-wave-mixing signals arising from Bloch oscillations in a semiconductor superlattice are computed consistently. It is predicted that Bloch oscillations should be observable also for miniband widths on the order of the exciton binding energy.
Publishing Year
Journal Title
Physical Review Letters
Volume
73
Issue
6
Page
902-905
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Cite this
Meier T, von Plessen G, Thomas P, Koch SW. Coherent electric-field effects in semiconductors. Physical Review Letters. 1994;73(6):902-905. doi:10.1103/PhysRevLett.73.902
Meier, T., von Plessen, G., Thomas, P., & Koch, S. W. (1994). Coherent electric-field effects in semiconductors. Physical Review Letters, 73(6), 902–905. https://doi.org/10.1103/PhysRevLett.73.902
@article{Meier_von Plessen_Thomas_Koch_1994, title={Coherent electric-field effects in semiconductors}, volume={73}, DOI={10.1103/PhysRevLett.73.902}, number={6}, journal={Physical Review Letters}, publisher={American Physical Society}, author={Meier, Torsten and von Plessen, G. and Thomas, P. and Koch, S.W.}, year={1994}, pages={902–905} }
Meier, Torsten, G. von Plessen, P. Thomas, and S.W. Koch. “Coherent Electric-Field Effects in Semiconductors.” Physical Review Letters 73, no. 6 (1994): 902–5. https://doi.org/10.1103/PhysRevLett.73.902.
T. Meier, G. von Plessen, P. Thomas, and S. W. Koch, “Coherent electric-field effects in semiconductors,” Physical Review Letters, vol. 73, no. 6, pp. 902–905, 1994, doi: 10.1103/PhysRevLett.73.902.
Meier, Torsten, et al. “Coherent Electric-Field Effects in Semiconductors.” Physical Review Letters, vol. 73, no. 6, American Physical Society, 1994, pp. 902–05, doi:10.1103/PhysRevLett.73.902.
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