Analysis of disorder-induced dephasing

T. Meier, S. Weiser, J. Möbius, A. Euteneuer, E.J. Mayer, W. Stolz, M. Hofmann, W.W. Rühle, P. Thomas, S.W. Koch, in: International Quantum Electronics Conference, IEEE, 2000.

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Conference Paper | Published | English
Author
Meier, TorstenLibreCat ; Weiser, S.; Möbius, J.; Euteneuer, A.; Mayer, E.J.; Stolz, W.; Hofmann, M.; Rühle, W.W.; Thomas, P.; Koch, S.W.
Abstract
A number of experiments yielded a polarization-dependent decay of the time-integrated four-wavemixing (TI-FWM). Often, the TI-FWM decays more rapidly for linear perpendicular than for linear parallel polarized incident pulses. It was suspected that this difference in the decay times is related to the inhomogeneous linewidth of the exciton, i.e. to disorder [1], On the other hand, it was demonstrated in a large number of recent publications, that the understanding of polarization-dependent FWM and pump-probe experiments following excitonic excitation requires the treatment of Coulomb correlations beyond the Hartree-Fock level. For not too strong disorder, these correlations still remain important and influence the nonlinear optical response [2]. A meaningful analysis of disorder effects thus has to include correlations.
Publishing Year
Proceedings Title
International Quantum Electronics Conference
Conference
International Quantum Electronics Conference 2000
Conference Location
Nice, France
Conference Date
2000-09-10 – 2000-09-15
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Meier T, Weiser S, Möbius J, et al. Analysis of disorder-induced dephasing. In: International Quantum Electronics Conference. IEEE; 2000. doi:10.1109/IQEC.2000.908038
Meier, T., Weiser, S., Möbius, J., Euteneuer, A., Mayer, E. J., Stolz, W., Hofmann, M., Rühle, W. W., Thomas, P., & Koch, S. W. (2000). Analysis of disorder-induced dephasing. International Quantum Electronics Conference. International Quantum Electronics Conference 2000, Nice, France. https://doi.org/10.1109/IQEC.2000.908038
@inproceedings{Meier_Weiser_Möbius_Euteneuer_Mayer_Stolz_Hofmann_Rühle_Thomas_Koch_2000, title={Analysis of disorder-induced dephasing}, DOI={10.1109/IQEC.2000.908038}, booktitle={International Quantum Electronics Conference}, publisher={IEEE}, author={Meier, Torsten and Weiser, S. and Möbius, J. and Euteneuer, A. and Mayer, E.J. and Stolz, W. and Hofmann, M. and Rühle, W.W. and Thomas, P. and Koch, S.W.}, year={2000} }
Meier, Torsten, S. Weiser, J. Möbius, A. Euteneuer, E.J. Mayer, W. Stolz, M. Hofmann, W.W. Rühle, P. Thomas, and S.W. Koch. “Analysis of Disorder-Induced Dephasing.” In International Quantum Electronics Conference. IEEE, 2000. https://doi.org/10.1109/IQEC.2000.908038.
T. Meier et al., “Analysis of disorder-induced dephasing,” presented at the International Quantum Electronics Conference 2000, Nice, France, 2000, doi: 10.1109/IQEC.2000.908038.
Meier, Torsten, et al. “Analysis of Disorder-Induced Dephasing.” International Quantum Electronics Conference, IEEE, 2000, doi:10.1109/IQEC.2000.908038.

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