Optical linearities in semiconductors
T. Meier, S.W. Koch, in: Photonic Systems and Applications in Defense and Manufacturing, SPIE, 1999, pp. 24–35.
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Meier, TorstenLibreCat 
;
Koch, S.W.
;
Koch, S.W.Department
Abstract
A microscope many-body theory for the nonlinear optical response of semiconductors is reviewed. The importance of Coulomb interaction induced carrier correlations is demonstrated in excitonic pump-probe spectra. The influence of excitonic and biexcitonic contributions to coherent pump- induced absorption changes at the exciton frequency are discussed. Absorption changes induced by incoherent exciton and unbound electron-hole populations are studied.
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Proceedings Title
Photonic Systems and Applications in Defense and Manufacturing
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SPIE Proceedings
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3898
Page
24-35
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Meier T, Koch SW. Optical linearities in semiconductors. In: Photonic Systems and Applications in Defense and Manufacturing. Vol 3898. SPIE Proceedings. SPIE; 1999:24-35. doi:10.1117/12.368481
Meier, T., & Koch, S. W. (1999). Optical linearities in semiconductors. Photonic Systems and Applications in Defense and Manufacturing, 3898, 24–35. https://doi.org/10.1117/12.368481
@inproceedings{Meier_Koch_1999, series={SPIE Proceedings}, title={Optical linearities in semiconductors}, volume={3898}, DOI={10.1117/12.368481}, booktitle={Photonic Systems and Applications in Defense and Manufacturing}, publisher={SPIE}, author={Meier, Torsten and Koch, S.W.}, year={1999}, pages={24–35}, collection={SPIE Proceedings} }
Meier, Torsten, and S.W. Koch. “Optical Linearities in Semiconductors.” In Photonic Systems and Applications in Defense and Manufacturing, 3898:24–35. SPIE Proceedings. SPIE, 1999. https://doi.org/10.1117/12.368481.
T. Meier and S. W. Koch, “Optical linearities in semiconductors,” in Photonic Systems and Applications in Defense and Manufacturing, 1999, vol. 3898, pp. 24–35, doi: 10.1117/12.368481.
Meier, Torsten, and S. W. Koch. “Optical Linearities in Semiconductors.” Photonic Systems and Applications in Defense and Manufacturing, vol. 3898, SPIE, 1999, pp. 24–35, doi:10.1117/12.368481.
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