Microscopic analysis of extreme nonlinear optics in semiconductors

T. Meier, D. Golde, S.W. Koch, in: Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division, 2006.

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Conference Paper | Published | English
Author
Meier, TorstenLibreCat ; Golde, Daniel; Koch, S.W.
Abstract
Extreme nonlinear optics denotes the regime where the Rabi frequency is comparable to or even larger than the band gap frequency. This regime can be reached experimentally by using intense ultrashort laser pulses which have a duration of just a few femtoseconds, see, e.g., [1]. As shown in [2] for the case of a two-level system, a theoretical analysis of extreme nonlinear optics requires one to describe the dynamics on ultrashort time scales beyond the rotating-wave approximation. Such calculations describe, e.g., the generation of higher harmonics and Mollow tripletts [1,2]. Here, we use a microscopic model of a two-band semiconductor with Coulomb interaction to analyze the regime of extreme nonlinear optics. It is, in particular, shown that the importance of excitonic effects which are known to dominate the nonlinear optical response at moderate excitation intensities become less important at largely elevated intensities
Publishing Year
Proceedings Title
Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division
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Verhandlungen der Deutschen Physikalischen Gesellschaft
Volume
41
Conference
Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division
Conference Location
Dresden, Germany
Conference Date
2006-03-27 – 2006-03-31
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Meier T, Golde D, Koch SW. Microscopic analysis of extreme nonlinear optics in semiconductors. In: Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division. Vol 41. Verhandlungen der Deutschen Physikalischen Gesellschaft. ; 2006.
Meier, T., Golde, D., & Koch, S. W. (2006). Microscopic analysis of extreme nonlinear optics in semiconductors. Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division, 41.
@inproceedings{Meier_Golde_Koch_2006, series={Verhandlungen der Deutschen Physikalischen Gesellschaft}, title={Microscopic analysis of extreme nonlinear optics in semiconductors}, volume={41}, booktitle={Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division}, author={Meier, Torsten and Golde, Daniel and Koch, S.W.}, year={2006}, collection={Verhandlungen der Deutschen Physikalischen Gesellschaft} }
Meier, Torsten, Daniel Golde, and S.W. Koch. “Microscopic Analysis of Extreme Nonlinear Optics in Semiconductors.” In Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division, Vol. 41. Verhandlungen Der Deutschen Physikalischen Gesellschaft, 2006.
T. Meier, D. Golde, and S. W. Koch, “Microscopic analysis of extreme nonlinear optics in semiconductors,” in Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division, Dresden, Germany, 2006, vol. 41.
Meier, Torsten, et al. “Microscopic Analysis of Extreme Nonlinear Optics in Semiconductors.” Meeting of the German Physical Society, Solid-State Physics Section, and the European Physical Society Condensed Matter Division, vol. 41, 2006.

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