UV-enhanced environmental charge compensation in near ambient pressure XPS

H. Müller, C. Weinberger, G. Grundmeier, M.T. de los Arcos de Pedro, Journal of Electron Spectroscopy and Related Phenomena 264 (2023).

Download
No fulltext has been uploaded.
Journal Article | Published | English
Publishing Year
Journal Title
Journal of Electron Spectroscopy and Related Phenomena
Volume
264
Article Number
147317
ISSN
LibreCat-ID

Cite this

Müller H, Weinberger C, Grundmeier G, de los Arcos de Pedro MT. UV-enhanced environmental charge compensation in near ambient pressure XPS. Journal of Electron Spectroscopy and Related Phenomena. 2023;264. doi:10.1016/j.elspec.2023.147317
Müller, H., Weinberger, C., Grundmeier, G., & de los Arcos de Pedro, M. T. (2023). UV-enhanced environmental charge compensation in near ambient pressure XPS. Journal of Electron Spectroscopy and Related Phenomena, 264, Article 147317. https://doi.org/10.1016/j.elspec.2023.147317
@article{Müller_Weinberger_Grundmeier_de los Arcos de Pedro_2023, title={UV-enhanced environmental charge compensation in near ambient pressure XPS}, volume={264}, DOI={10.1016/j.elspec.2023.147317}, number={147317}, journal={Journal of Electron Spectroscopy and Related Phenomena}, publisher={Elsevier BV}, author={Müller, Hendrik and Weinberger, Christian and Grundmeier, Guido and de los Arcos de Pedro, Maria Teresa}, year={2023} }
Müller, Hendrik, Christian Weinberger, Guido Grundmeier, and Maria Teresa de los Arcos de Pedro. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” Journal of Electron Spectroscopy and Related Phenomena 264 (2023). https://doi.org/10.1016/j.elspec.2023.147317.
H. Müller, C. Weinberger, G. Grundmeier, and M. T. de los Arcos de Pedro, “UV-enhanced environmental charge compensation in near ambient pressure XPS,” Journal of Electron Spectroscopy and Related Phenomena, vol. 264, Art. no. 147317, 2023, doi: 10.1016/j.elspec.2023.147317.
Müller, Hendrik, et al. “UV-Enhanced Environmental Charge Compensation in near Ambient Pressure XPS.” Journal of Electron Spectroscopy and Related Phenomena, vol. 264, 147317, Elsevier BV, 2023, doi:10.1016/j.elspec.2023.147317.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar