Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays

F. Winkel, O. Wallscheid, P. Scholz, J. Böcker, IEEE Open Journal of the Industrial Electronics Society (2023) 1–14.

Download
No fulltext has been uploaded.
Journal Article | Published | English
Author
Winkel, Fabian; Wallscheid, OliverLibreCat ; Scholz, Peter; Böcker, JoachimLibreCat
Publishing Year
Journal Title
IEEE Open Journal of the Industrial Electronics Society
Page
1-14
ISSN
LibreCat-ID

Cite this

Winkel F, Wallscheid O, Scholz P, Böcker J. Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays. IEEE Open Journal of the Industrial Electronics Society. Published online 2023:1-14. doi:10.1109/ojies.2023.3323870
Winkel, F., Wallscheid, O., Scholz, P., & Böcker, J. (2023). Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays. IEEE Open Journal of the Industrial Electronics Society, 1–14. https://doi.org/10.1109/ojies.2023.3323870
@article{Winkel_Wallscheid_Scholz_Böcker_2023, title={Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays}, DOI={10.1109/ojies.2023.3323870}, journal={IEEE Open Journal of the Industrial Electronics Society}, publisher={Institute of Electrical and Electronics Engineers (IEEE)}, author={Winkel, Fabian and Wallscheid, Oliver and Scholz, Peter and Böcker, Joachim}, year={2023}, pages={1–14} }
Winkel, Fabian, Oliver Wallscheid, Peter Scholz, and Joachim Böcker. “Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays.” IEEE Open Journal of the Industrial Electronics Society, 2023, 1–14. https://doi.org/10.1109/ojies.2023.3323870.
F. Winkel, O. Wallscheid, P. Scholz, and J. Böcker, “Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays,” IEEE Open Journal of the Industrial Electronics Society, pp. 1–14, 2023, doi: 10.1109/ojies.2023.3323870.
Winkel, Fabian, et al. “Pseudo-Labeling Machine Learning Algorithm for Predictive Maintenance of Relays.” IEEE Open Journal of the Industrial Electronics Society, Institute of Electrical and Electronics Engineers (IEEE), 2023, pp. 1–14, doi:10.1109/ojies.2023.3323870.

Export

Marked Publications

Open Data LibreCat

Search this title in

Google Scholar