An applied noise model for scintillation-based CCD detectors in transmission electron microscopy
C. Zietlow, J.K.N. Lindner, Scientific Reports 15 (2025).
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Author
Zietlow, Christian;
Lindner, Jörg K. N.LibreCat
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Journal Title
Scientific Reports
Volume
15
Issue
1
Article Number
3815
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Zietlow C, Lindner JKN. An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. Scientific Reports. 2025;15(1). doi:10.1038/s41598-025-85982-4
Zietlow, C., & Lindner, J. K. N. (2025). An applied noise model for scintillation-based CCD detectors in transmission electron microscopy. Scientific Reports, 15(1), Article 3815. https://doi.org/10.1038/s41598-025-85982-4
@article{Zietlow_Lindner_2025, title={An applied noise model for scintillation-based CCD detectors in transmission electron microscopy}, volume={15}, DOI={10.1038/s41598-025-85982-4}, number={13815}, journal={Scientific Reports}, publisher={Springer Science and Business Media LLC}, author={Zietlow, Christian and Lindner, Jörg K. N.}, year={2025} }
Zietlow, Christian, and Jörg K. N. Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” Scientific Reports 15, no. 1 (2025). https://doi.org/10.1038/s41598-025-85982-4.
C. Zietlow and J. K. N. Lindner, “An applied noise model for scintillation-based CCD detectors in transmission electron microscopy,” Scientific Reports, vol. 15, no. 1, Art. no. 3815, 2025, doi: 10.1038/s41598-025-85982-4.
Zietlow, Christian, and Jörg K. N. Lindner. “An Applied Noise Model for Scintillation-Based CCD Detectors in Transmission Electron Microscopy.” Scientific Reports, vol. 15, no. 1, 3815, Springer Science and Business Media LLC, 2025, doi:10.1038/s41598-025-85982-4.
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