In Situ PM‐IRRAS and XPS Analysis of Nitrogen Plasma Surface Modification of Polylactide Thin Films

<jats:title>ABSTRACT</jats:title> <jats:p>Spin‐coated polylactide (PLA) thin films were exposed to nitrogen plasma for varying time intervals. The progressive etching of the PLA film in direct contact with the nitrogen plasma was monitored in situ using polarization modulated infrared reflection absorption spectroscopy (PM‐IRRAS). No appreciative changes in composition were seen with PM‐IRRAS, indicating that the etching did not significantly affect the bulk composition. Atomic force microscopy characterization of the plasma‐etched films showed that the PLA films are homogeneously etched. Subsequent ex situ XPS analysis of the treated surface revealed the presence of C‐N bonds in the surface‐near region that could be associated with amino and/or amide surface species. PLA films were also alternatively exposed to nitrogen ion beams produced by an electron‐cyclotron‐resonance (ECR) plasma source and were investigated in vacuo by XPS. This treatment revealed the partial substitution of surface oxygen species by nitrogen, resulting in a similar surface modification as in the plasma case. The comparison of XPS data and water contact angle studies suggest that the activated surfaces show a reorientation of macromolecular fragments in the surface‐near region depending on the polarity of the phase with which they are in contact. Under ultra‐high vacuum (UHV) conditions, the surface tends to lower its surface energy, while in contact with the aqueous phase, subsurface polar groups orientate outwards, which enables the formation of hydrogen bonds.</jats:p>